參數(shù)資料
型號： ADS1191IPBS
廠商： Texas Instruments
文件頁數(shù)： 12/67頁
文件大小： 0K
描述： IC AFE 16BIT 8KSPS 1CH 32TQFP
標準包裝： 250
位數(shù)： 16
通道數(shù)： 1
電壓 - 電源，模擬： 2.7 V ~ 5.25 V
電壓 - 電源，數(shù)字： 1.7 V ~ 3.6 V
封裝/外殼： 32-TQFP
供應商設備封裝： 32-TQFP（5x5）
包裝： 管件
SBAS566A – DECEMBER 2011 – REVISED SEPTEMBER 2012
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
FAMILY AND ORDERING INFORMATION(1)
MAXIMUM
OPERATING
PACKAGE
NUMBER OF
ADC
SAMPLE
TEMPERATU
RESPIRATION
PRODUCT
OPTION
DESIGNATOR
CHANNELS
RESOLUTION
RATE (kSPS)
RE RANGE
CIRCUITRY
–40°C to
TQFP
PBS
1
16
8
No
+85°C
ADS1191IPBS
–40°C to
QFN
RSM
1
24
8
No
+85°C
–40°C to
TQFP
PBS
2
16
8
No
+85°C
ADS1192IPBS
–40°C to
QFN
RSM
2
24
8
No
+85°C
–40°C to
TQFP
PBS
1
24
8
No
+85°C
ADS1291IPBS
–40°C to
QFN
RSM
1
24
8
No
+85°C
–40°C to
TQFP
PBS
2
24
8
No
+85°C
ADS1292IPBS
–40°C to
QFN
RSM
2
24
8
No
+85°C
–40°C to
TQFP
PBS
2
24
8
Yes
+85°C
ADS1292RIPBS
–40°C to
QFN
RSM
2
24
8
Yes
+85°C
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1)
Over operating free-air temperature range, unless otherwise noted.
VALUE
UNIT
AVDD to AVSS
–0.3 to +7
V
DVDD to DGND
–0.3 to +7
V
AVSS to DGND
–3 to +0.2
V
Analog input to AVSS
AVSS – 0.3 to AVDD + 0.3
V
Digital input to DVDD
DVSS – 0.3 to DVDD + 0.3
V
Input current to any pin except supply pins(2)
±10
mA
Momentary
±100
mA
Input current
Continuous
±10
mA
Operating temperature range Industrial-grade devices only
–40 to +85
°C
Storage temperature range
–60 to +150
°C
Maximum junction temperature (TJ)
+150
°C
Human body model (HBM)
±1000
V
JEDEC standard 22, test method A114-C.01, all pins
Electrostatic discharge
(ESD) ratings
Charged device model (CDM)
±500
V
JEDEC standard 22, test method C101, all pins
(1)
Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
(2)
Input terminals are diode-clamped to the power-supply rails. Input signals that can swing beyond the supply rails must be current limited
to 10 mA or less.
2
Copyright 2011–2012, Texas Instruments Incorporated
Product Folder Links: ADS1191 ADS1192
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