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參數(shù)資料
| 型號： | AD9258BCPZ-125 |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 28/44頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ADC 14BIT 125MSPS DL 64LFCSP |
| 設(shè)計資源： | High Performance, Dual Channel IF Sampling Receiver (CN0140) |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 位數(shù)： | 14 |
| 采樣率（每秒）： | 125M |
| 數(shù)據(jù)接口： | 串行 |
| 轉(zhuǎn)換器數(shù)目： | 2 |
| 功率耗散（最大）： | 788mW |
| 電壓電源： | 模擬和數(shù)字 |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 64-VFQFN 裸露焊盤，CSP |
| 供應(yīng)商設(shè)備封裝： | 64-LFCSP-VQ（9x9） |
| 包裝： | 托盤 |
| 輸入數(shù)目和類型： | 2 個差分，單極 |
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AD9258
Rev. A | Page 34 of 44
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9258 includes built-in test features designed to enable
verification of the integrity of each channel as well as facilitate
board level debugging. A BIST (built-in self-test) feature is included
that verifies the integrity of the digital datapath of the AD9258.
Various output test options are also provided to place predictable
values on the outputs of the AD9258.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9258 signal path. When enabled, the test runs from an internal
pseudorandom noise (PN) source through the digital datapath
starting at the ADC block output. The BIST sequence runs for
512 cycles and stops. The BIST signature value for Channel A or
Channel B is placed in Register 0x24 and Register 0x25. If one
channel is chosen, its BIST signature is written to the two registers.
If both channels are chosen, the results from Channel A are placed
in the BIST signature registers.
The outputs are not disconnected during this test, so the PN
sequence can be observed as it runs. The PN sequence can be
continued from its last value or reset from the beginning, based
on the value programmed in Register 0x0E, Bit 2. The BIST
signature result varies based on the channel configuration.
OUTPUT TEST MODES
The output test options are shown in Table 17. When an output
test mode is enabled, the analog section of the ADC is discon-
nected from the digital back end blocks, and the test pattern is run
through the output formatting block. Some of the test patterns are
subject to output formatting, and some are not. The seed value for
the PN sequence tests can be forced if the PN reset bits are used
to hold the generator in reset mode by setting Bit 4 or Bit 5 of
Register 0x0D. These tests can be performed with or without
an analog signal (if present, the analog signal is ignored), but
they do require an encode clock. For more information, see the
AN-877 Application Note, Interfacing to High Speed ADCs via SPI.
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| AD9258BCPZ-1251 | 制造商:AD 制造商全稱:Analog Devices 功能描述:14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Dual Analog-to-Digital Converter (ADC) |
| AD9258BCPZ-80 | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC Dual 14 bit 80 high SNR ADC RoHS:否 制造商:Analog Devices 通道數(shù)量: 結(jié)構(gòu): 轉(zhuǎn)換速率: 分辨率: 輸入類型: 信噪比: 接口類型: 工作電源電壓: 最大工作溫度: 安裝風(fēng)格: 封裝 / 箱體: |
| AD9258BCPZ-801 | 制造商:AD 制造商全稱:Analog Devices 功能描述:14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Dual Analog-to-Digital Converter (ADC) |
| AD9258BCPZRL7-105 | 功能描述:模數(shù)轉(zhuǎn)換器 - ADC Dual 14 bit 105 highSNR ADC RoHS:否 制造商:Analog Devices 通道數(shù)量: 結(jié)構(gòu): 轉(zhuǎn)換速率: 分辨率: 輸入類型: 信噪比: 接口類型: 工作電源電壓: 最大工作溫度: 安裝風(fēng)格: 封裝 / 箱體: |
| AD9258BCPZRL7-1051 | 制造商:AD 制造商全稱:Analog Devices 功能描述:14-Bit, 80 MSPS/105 MSPS/125 MSPS, 1.8 V Dual Analog-to-Digital Converter (ADC) |
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