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參數(shù)資料
| 型號： | AD8159ASVZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 6/24頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC MUX/DEMUX QUAD BUFF 100TQFP |
| 標(biāo)準(zhǔn)包裝： | 1 |
| 系列： | XStream™ |
| 應(yīng)用： | 2:1 多路復(fù)用器/1:2 多路分配器 |
| 接口： | 串行 |
| 電源電壓： | 3 V ~ 3.6 V |
| 封裝/外殼： | 100-TQFP 裸露焊盤 |
| 供應(yīng)商設(shè)備封裝： | 100-TQFP-EP（14x14） |
| 包裝： | 管件 |
| 安裝類型： | 表面貼裝 |
| 產(chǎn)品目錄頁面： | 801 (CN2011-ZH PDF) |
AD8159
Rev. B | Page 14 of 24
TEST CIRCUITS
All graphs were generated using the setup shown in Figure 31, unless otherwise specified.
05
61
1-
03
0
0.25"
TERADYNE FR4 TEST BACKPLANE
DIFFERENTIAL STRIPLINE TRACES
8mm WIDE, 8mm SPACE, 8mm HEIGHT
TRACE LENGTHS = 6", 18", 24", 30" + 3" × 2 DAUGHTER CARDS
GBX4 TO SMA DAUGHTER CARDS
Figure 30. Test Backplane
05
61
1-
03
1
A
B
C
A
B
AD8159
AC-COUPLED
EVALUATION BOARD
TEST BACKPLANE
50
HIGH SPEED
REAL-TIME
OSCILLOSCOPE
50
50 CABLE
PATTERN
GENERATOR
DATA OUT
NOTES
1. SINGLE-ENDED REPRESENTATION
Figure 31. AC-Coupled Test Circuit
056
11-
033
A
B
C
A
B
AD8159
AC-COUPLED
EVALUATION BOARD
TEST BACKPLANE
50
50 CABLE
PATTERN
GENERATOR
DATA OUT
HIGH SPEED
REAL-TIME
OSCILLOSCOPE
50
A
B
C
A
B
AD8159
AC-COUPLED
EVALUATION BOARD
50
50 CABLE
NOTES
1. SINGLE-ENDED REPRESENTATION
DEVICE UNDER TEST
05
61
1-
0
34
50 CABLE
PATTERN
GENERATOR
DATA OUT
HIGH SPEED
SAMPLING
OSCILLOSCOPE
50
A
B
C
A
B
AD8159
AC-COUPLED
EVALUATION BOARD
50 CABLE
NOTES
1. SINGLE-ENDED REPRESENTATION
50
Figure 33. Random Jitter Test Circuit, Test Circuit Used for Figure 24
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| AD8159-EVAL-AC | 制造商:Analog Devices 功能描述:EVAL KIT FOR AC-COUPLED EVAL BD - Bulk |
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| AD8159XSVZ | 制造商:Analog Devices 功能描述:QUAD-LANE 3.2GBPS 2:1 MUX / 1:2 DEMUX SWITCH 100-PIN TQFP_EP - Trays |
| AD815ARB24 | 制造商:Analog Devices 功能描述: |
| AD815ARB-24 | 制造商:Rochester Electronics LLC 功能描述:SOIC HIGH OUTPUT CURRENT DIFF DRIVER - Bulk 制造商:Analog Devices 功能描述:Operational Amplifier IC Number of Ampli 制造商:Analog Devices Inc. 功能描述:High Output Current Differential Driver |
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