High Precision Linear Hall-Effect Sensor IC
With an Open Drain Pulse Width Modulated Output
A1356
9
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
Quiescent Duty Cycle Output Programming Resolution
The programming resolution for any device is half of its pro-
gramming step size. Therefore, the typical programming resolu-
tion will be:
Err
PGD(Q)
(typ)
=
0.5 ?/SPAN> Step
D(Q)
(typ)
.
(2)
Quiescent Duty Cycle Output Drift through Tempera-
ture Range Due to internal component tolerances and thermal
considerations, the quiescent Duty Cycle Temperature Coeffi-
cient, D
TC
(Q), may drift from its nominal value over the operat-
ing ambient temperature, T
A
. For purposes of specification, the
Quiescent Duty Cycle Output Drift Through Temperature Range,
D
(Q)
(% D), is defined as:
D
(Q)(TA)
D
(Q)(25癈)
D
(Q)
=
,
(3)
where D
(Q)(TA)
is the quiescent duty cycle measured at T
A
and is
D
(Q)(25癈)
quiescent duty cycle measured at 25癈.
Sensitivity The presence of a south polarity magnetic field,
perpendicular to the branded surface of the package face,
increases the output duty cycle from its quiescent value toward
the maximum duty cycle limit. The amount of the output duty
cycle increase is proportional to the magnitude of the magnetic
field applied. Conversely, the application of a north polarity
field decreases the output duty cycle from its quiescent value.
This proportionality is specified as the magnetic sensitivity,
Sens ((% D)/G), of the device, and it is defined for bipolar
devices as:
D
(BPOS)
D
(BNEG)
BPOS BNEG
Sens =
,
(4)
and for unipolar devices as:
D
(BPOS)
D
(Q)
BPOS
Sens
=
,
(5)
where BPOS and BNEG are two magnetic fields with opposite
polarities.
Guaranteed Sensitivity Range The magnetic sensitivity,
Sens, can be programmed around its nominal value within the
sensitivity range limits: Sens(min) and Sens(max). Refer to the
Guaranteed Quiescent Duty Cycle Output Range section for a
conceptual explanation of how value distributions and ranges are
related.
Average Sensitivity Step Size Refer to the Average Qui-
escent Duty Cycle Output Step Size section for a conceptual
explanation.
Sensitivity Programming Resolution Refer to the Quies-
cent Duty Cycle Output Programming Resolution section for a
conceptual explanation.
Carrier Frequency Target The PWM output signal Carrier
Frequency Programming Range, f
PWM
, can be programmed to its
nominal value of 2 kHz.
Average Carrier Frequency Step Size Refer to the Average
Quiescent Duty Cycle Output Step Size section for a conceptual
explanation.
Carrier Frequency Programming Resolution Refer to the
Quiescent Duty Cycle Output Programming Resolution section
for a conceptual explanation.
Sensitivity Temperature Coefficient Device sensitivity
changes as temperature changes, with respect to its programmed
sensitivity temperature coefficient, SENS
TC
. SENS
TC
is pro-
grammed at 150癈, and calculated relative to the nominal
sensitivity programming temperature of 25癈. SENS
TC
(%/癈) is
defined as:
Sens
T2
Sens
T1
Sens
T1
T2T1
1
Sens
TC
=
?SPAN class="pst A1356LKB-T_2172166_2">
100%
,
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
?/DIV>
(6)
where T1 is the nominal Sens programming temperature of
25癈, and T2 is the programming temperature of 150癈. The
expected value of Sens over the full ambient temperature range,
Sens
EXPECTED(TA)
, is defined as:
Sens
T1
?[100% +Sens
TC
(T
A
T1)]
Sens
EXPECTED(TA)
=
.
100 %
(7)
Sens
EXPECTED (TA)
should be calculated using the actual measured
values of Sens
T1
and SENS
TC
rather than programming target
values.
Sensitivity Drift Through Temperature Range Sec-
ond order sensitivity temperature coefficient effects cause the
magnetic sensitivity, Sens, to drift from its expected value over
the operating ambient temperature range, T
A
. For purposes of
specification, the Sensitivity Drift Through Temperature Range,
Sens
TC
, is defined as:
Sens
TA
Sens
EXPECTED(TA)
Sens
EXPECTED(TA)
Sens
TC
=
?SPAN class="pst A1356LKB-T_2172166_2">
100% .
(8)
Sensitivity Drift Due to Package Hysteresis Package
stress and relaxation can cause the device sensitivity at T
A
= 25癈
to change during and after temperature cycling.
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