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參數(shù)資料
| 型號： | A1356LKB-T |
| 廠商： | Allegro Microsystems Inc |
| 文件頁數(shù)： | 15/20頁 |
| 文件大小： | 432K |
| 描述： | IC SENSOR HALL EFFECT 3 SIP |
| 標準包裝： | 4,000 |
| 傳感范圍： | 45m%D/G ~ 75m%D/G |
| 類型： | 線性 - 可編程 |
| 電源電壓： | 4.5 V ~ 18 V |
| 電流 - 電源： | 10mA |
| 電流 - 輸出（最大）： | 25mA |
| 輸出類型： | 數(shù)字式， PWM 編碼 |
| 特點： | 高精度 |
| 工作溫度： | -40°C ~ 150°C |
| 封裝/外殼： | 3-SIP |
| 供應商設備封裝： | 3-SIP |
| 包裝： | 散裝 |
| 其它名稱： | 620-1369 A1356LK-T |
High Precision Linear Hall-Effect Sensor IC
With an Open Drain Pulse Width Modulated Output
A1356
15
Allegro MicroSystems, LLC
115 Northeast Cutoff
Worcester, Massachusetts 01615-0036 U.S.A.
1.508.853.5000; www.allegromicro.com
the VCC pin, allowing its value to be measured. To test an addi-
tional programmable parameter in conjunction with the original,
enter an additional V
P(HIGH)
pulse on the VCC pin to reenter the
parameter selection field. Select a different parameter register,
and address its bit field, without any supply interruptions. Both
parameter values will be stored and can be measured after remov-
ing the programming drive voltage. Multiple programming com-
binations can be tested to achieve optimal application accuracy.
See figure 8 for an example of the Try mode pulse train.
Registers can be addressed and re-addressed an indefinite number
of times in any order. After the required code is found for each
register, cycle the supply and blow the bit field using Blow mode.
Blow Mode After the required value of the programmable
parameter is found using Try mode, its corresponding code
should be blown to make its value permanent. To do this, select
the required parameter register, and address and blow each
required bit separately (as described in the Fuse Blowing sec-
tion). The supply must be cycled between blowing each bit of a
given code. After a bit is blown, cycling the supply will not reset
its value.
Single parameters can be still addressed in the Blow mode before
fuse blowing. Simultaneous addressing of multiple parameters,
as in Try mode, is not possible. After powering the V
CC
supply,
select the desired parameter register and address its bit field.
When addressing the bit field, each V
P(MID)
pulse increments the
value of the parameter register, up to the maximum possible code
(see Programming Logic table). The addressed parameter value
is stored in the device even after the programming drive voltage
is removed from the VCC pin, allowing its value to be measured.
It is not possible to decrease the value of the register without
resetting the parameter bit field. To reset the bit field, and thus
the value of the programmable parameter, cycle the supply, V
CC
,
voltage.
It is possible to switch between Try and Blow modes, in that after
individual programmable parameters have been blown in Blow
mode, other parameters can be still tested in Try mode.
Lock Mode To lock the device, address the Lock bit and apply
a blow pulse with C
BLOW
in place. After locking the device, no
future programming of any parameter is possible.
V+
0
Mode
Selection
Parameter
Selection
(Key 2, Try Mode)
V
P(HIGH)
V
P(MID)
V
P(LOW)
(Key 1)
(Code 3)
Addressing
Parameter
Selection
(Key 2)
(Code 2)
Addressing
1 2
1
1 2
1 2
1 2
3
Figure 8. Example of Try mode programming pulses applied to the VCC pin. In this example,
Sensitivity (parameter key 1) is addressed to code 3, and D
(Q)
(parameter key 2) is addressed
to code 2. The values set in the Sensitivity and D
(Q)
registers will be held in the device until the
supply is cycled. Permanent fuse blowing cannot be accomplished in Try mode.
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