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參數資料
| 型號： | 9601-11 |
| 廠商： | PEREGRINE SEMICONDUCTOR CORP |
| 元件分類： | PLL合成/DDS/VCOs |
| 英文描述： | 2200 MHz UltraCMOS⑩ Integer-N PLL for Rad Hard Applications |
| 中文描述： | PHASE LOCKED LOOP, CQCC44 |
| 封裝： | CERAMIC, QFJ-44 |
| 文件頁數： | 12/14頁 |
| 文件大?。?/td> | 257K |
| 代理商： | 9601-11 |
Product Specification
PE9601
Page 7 of 14
Document No. 70-0025-05
│ www.psemi.com
2005 Peregrine Semiconductor Corp. All rights reserved.
Table 6. AC Characteristics
VDD = 3.0 V, -40° C < TA < 85° C, unless otherwise specified
Symbol
Parameter
Test Program Name
Conditions
Min
Max
Units
Control Interface and Latches (see Figure 5 and Figure 6)
fClk
Serial data clock frequency
(Note 1)
10
MHz
tClkH
Serial clock HIGH time
t_clk_H (s)
30
ns
tClkL
Serial clock LOW time
t_clk_L (s)
30
ns
tDSU
Sdata set-up time after Sclk rising
edge, D[7:0] set-up time to
M1_WR, M2_WR, A_WR, E_WR
rising edge
t_dsu_”xxx” (s) where
“xxx” is name of pin being
tested
10
ns
tDHLD
Sdata hold time after Sclk rising
edge, D[7:0] hold time to M1_WR,
M2_WR, A_WR rising edge
t_dhid_”xxx” (s) where
“xxx” is name of pin being
tested
10
ns
tPW
S_WR, M1_WR, M2_WR, A_WR,
E_WR pulse width
t_pw_”xxx” (s) where “xxx”
is name of pin being
tested
30
ns
tCWR
Sclk rising edge to S_WR rising
edge. S_WR, M1_WR, M2_WR,
A_WR falling edge to Hop_WR
rising edge
t_cwr_”xxx” (s) where
“xxx” is name of pin being
tested
30
ns
tCE
Sclk falling edge to E_WR
transition
t_ce (s)
30
ns
tWRC
S_WR falling edge to Sclk rising
edge. Hop_WR falling edge to
S_WR, M1_WR, M2_WR, A_WR
rising edge
t_wrc_”xxx” (s) where
“xxx” is name of pin being
tested
30
ns
tEC
E_WR transition to Sclk rising
edge
t_ec (s)
30
ns
Main Divider (Including Prescaler)
Fin
Operating frequency
RF_sens
200
2200
MHz
PFin
Input level range
RF_sens
External AC coupling
0
5
dBm
Main Divider (Prescaler Bypassed)
Fin
Operating frequency
20
220
MHz
PFin
Input level range
External AC coupling
-5
5
dBm
Reference Divider
fr
Operating frequency
Fc_sens
(Note 3)
100
MHz
Pfr
Reference input power (Note 2)
Fc_sens
Single ended input
-2
dBm
Phase Detector
fc
Comparison frequency
(Note 3)
20
MHz
Note 1:
Fclk is verified during the functional pattern test. Serial programming sections of the functional pattern are clocked at 10 MHz to verify Fclk
specification.
Note 2:
CMOS logic levels can be used to drive reference input if DC coupled. Voltage input needs to be a minimum of 0.5Vp-p.
Note 3:
Parameter is guaranteed through characterization only and is not tested.
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