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參數(shù)資料
| 型號： | 7MBR30UF060 |
| 廠商： | FUJI ELECTRIC CO LTD |
| 元件分類： | IGBT 晶體管 |
| 英文描述： | Power Integrated Module |
| 中文描述： | 45 A, 600 V, N-CHANNEL IGBT |
| 封裝： | MODULE-34 |
| 文件頁數(shù)： | 8/16頁 |
| 文件大小： | 1014K |
| 代理商： | 7MBR30UF060 |
D
H04-004-03a
MS6M00816
8/16
T
D
o
f
F
FujiElectricDeviceTechnologyCo.,Ltd.
Reliability Test Items
Test
cate-
gories
Test items
Test methods and conditions
Reference
norms
EIAJ ED-4701
(Aug.-2001 edition)
Number
of sample
Accept-
ance
number
1 Terminal Strength
(Pull test)
2 Mounting Strength
Pull force
Test time
Screw torque
Test time
: 10N
: 10±1 sec.
: 1.3 ~ 1.7 N
m (M4)
: 10±1 sec.
Test Method 401
5
( 0 : 1 )
Method
Ⅰ
Test Method 402
method
Ⅱ
5
( 0 : 1 )
3 Vibration
Range of frequency : 0.1 ~ 500Hz
Sweeping time
Acceleration
Sweeping direction : Each X,Y,Zaxis
Test time
Maximum acceleration
Pulse width
Direction
Test time
Storage temp.
Test duration
Storage temp.
Test duration
Storage temp.
Relative humidity
Test duration
Test Method 403
Reference 1
Condition code B
5
( 0 : 1 )
: 15 min.
: 100m/s
2
: 3 hr. (1hr./direction)
: 9800m/s
2
: 0.5msec.
: Each X,Y,Zaxis
: 3 times/direction
: 125±5
℃
: 1000hr.
: -40±5
℃
: 1000hr.
: 85±2
℃
: 85±5%
: 1000hr.
4 Shock
Test Method 404
Condition code D
5
( 0 : 1 )
1 High Temperature
Storage
2 Low Temperature
Storage
3 Temperature
Humidity
Storage
4 Temperature
Cycle
Test Method 201
5
( 0 : 1 )
Test Method 202
5
( 0 : 1 )
Test Method 103
Test code C
5
( 0 : 1 )
Test Method 105
5
( 0 : 1 )
Test temp.
:
Low temp. -40
±
5
℃
RT
5 ~ 35
℃
Dwell time
: High ~ RT ~ Low ~ RT
1hr. 0.5hr. 1hr. 0.5hr.
: 100 cycles
Number of cycles
5 Thermal Shock
+0
Test Method 307
method
Ⅰ
5
( 0 : 1 )
Test temp.
:
High temp. 100
-5
℃
+5
Condition code A
Low temp.
0
-0
℃
Used liquid : Water with ice and boiling water
Dipping time
Transfer time
Number of cycles
: 5 min. par each temp.
: 10 sec.
: 10 cycles
M
E
Not recommend for new design.
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