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參數(shù)資料
| 型號： | 74F2373 |
| 廠商： | NXP Semiconductors N.V. |
| 英文描述： | Octal transparent latch with 30Ωequivalent output termination (3-State)(帶30Ω等值輸出終端電阻的八透明鎖存器（三態(tài)）) |
| 中文描述： | 八路透明鎖存30Ωequivalent輸出端接（3態(tài)）（帶30Ω等值輸出終端電阻的八透明鎖存器（三態(tài)）） |
| 文件頁數(shù)： | 4/10頁 |
| 文件大?。?/td> | 84K |
| 代理商： | 74F2373 |
Philips Semiconductors
Octal transparent latch with 30
equivalent output
termination (3-State)
Product specification
74F2373
1999 Feb 01
4
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
SYMBOL
PARAMETER
V
CC
Supply voltage
V
IN
Input voltage
I
IN
Input current
V
OUT
Voltage applied to output in high output state
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
UNIT
V
V
mA
-0.5 to V
CC
V
I
OUT
Current applied to output in low output state
24
mA
T
amb
T
stg
Operating free air temperature range
Storage temperature range
0 to +70
–65 to +150
°
C
°
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
NOM
5.0
UNIT
MIN
4.5
MAX
5.5
V
CC
V
IH
V
IL
I
Ik
I
OH
I
OL
T
amb
12mA with reduced noise margin
Supply voltage
High-level input voltage
Low-level input voltage
Input clamp current
High-level output current
Low-level output current
V
2.0
V
V
0.8
–18
–3*
5*
mA
mA
mA
°
C
Operating free air temperature range
0
+70
*
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
TYP
2
UNIT
CONDITIONS
1
MIN
2.4
MAX
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN, I
OH
= –3mA
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN, I
OH
= –12mA
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN, I
OL
= –5mA
V
CC
= MIN, V
IL
= MAX,
V
IH
= MIN, I
OL
= 12mA
V
CC
= MIN, I
I
= I
IK
V
CC
= MAX, V
I
= 7.0V
V
CC
= MAX, V
I
= 2.7V
V
CC
= MAX, V
I
= 0.5V
V
CC
= MAX, V
O
= 2.7V
V
CC
= MAX, V
O
= 0.5V
V
CC
= MAX
V
CC
= MAX
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
±
10%V
CC
±
5%V
CC
V
V
OH
High level output voltage
High-level output voltage
2.7
3.4
V
2.0
V
2.0
V
V
V
V
V
V
μ
A
μ
A
mA
μ
A
μ
A
0.42
0.42
0.67
0.67
-0.73
0.50
0.50
V
OL
Low-level output voltage
Low-level out ut voltage
V
IK
I
I
I
IH
I
IL
I
OZH
I
OZL
I
OS
I
CC
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
Input clamp voltage
Input current at maximum input voltage
High-level input current
Low-level input current
Off-state output current, high-level voltage applied
-1.2
100
20
-0.6
50
Off-state output current, low-level voltage applied
Short-circuit output current
3
-50
-60
-150
mA
Supply current (total)
35
60
mA
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