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參數(shù)資料
| 型號(hào)： | 74F125 |
| 廠商： | Fairchild Semiconductor Corporation |
| 英文描述： | Quad Buffer (3-STATE) |
| 中文描述： | 四緩沖器（三態(tài)） |
| 文件頁(yè)數(shù)： | 4/10頁(yè) |
| 文件大?。?/td> | 77K |
| 代理商： | 74F125 |
Philips Semiconductors
Product specification
74F125, 74F126
Quad buffers (3-State)
March 28, 1989
4
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
Supply voltage
4.5
5.0
5.5
V
V
IH
High-level input voltage
2.0
V
V
IL
Low-level input voltage
0.8
V
I
IK
Input clamp current
–18
mA
I
OH
High-level output current
–15
mA
I
OL
Low-level output current
64
mA
T
amb
Operating free air temperature range
0
+70
°
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
MIN
TYP
2
MAX
= 3mA
I
OH
=–3mA
±
10%V
CC
2.4
V
V
OH
High level output voltage
High-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
±
5%V
CC
2.7
3.3
V
= 15mA
I
OH
=–15mA
±
10%V
CC
2.0
V
±
5%V
CC
2.0
V
V
OL
Low level output voltage
Low-level output voltage
V
CC
= MIN,
V
IL
= MAX,
V
IH
= MIN
I
OH
= MAX
±
10%V
CC
0.55
V
±
5%V
CC
0.42
0.55
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
–0.73
–1.2
V
I
I
Input current at maximum input voltage
V
CC
= 0.0V, V
I
= 7.0V
100
μ
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
μ
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
–20
μ
A
I
OZH
Off-state output current,
High-level voltage applied
V
CC
= MAX, V
O
= 2.7V
50
μ
A
I
OZL
Off-state output current,
Low-level voltage applied
V
CC
= MAX, V
O
= 0.5V
–50
μ
A
I
OS
Short circuit output current
3
V
CC
= MAX
–100
–225
mA
I
CCH
OEn = GND, Dn = 4.5V
17
24
mA
74F125
I
CCL
V
CC
= MAX
OEn = Dn = GND
28
40
mA
I
CC
Supply current (total)
I
CCZ
OEn = Dn = 4.5V
25
35
mA
I
CCH
OEn = Dn = 4.5V
20
30
mA
74F126
I
CCL
V
CC
= MAX
OEn = 4.5V, Dn = GND
32
48
mA
I
CCZ
OEn = GND, Dn = 4.5V
26
39
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
°
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
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