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參數(shù)資料
| 型號(hào)： | WS57C128FB-55CMB |
| 元件分類(lèi)： | PROM |
| 英文描述： | 16K X 8 UVPROM, 55 ns, CQCC32 |
| 封裝： | CERAMIC, LCC-32 |
| 文件頁(yè)數(shù)： | 3/5頁(yè) |
| 文件大小： | 49K |
| 代理商： | WS57C128FB-55CMB |
SYMBOL
PARAMETER
CONDITIONS
TYP(7)
MAX
UNITS
CIN
Input Capacitance
VIN = 0V
4
6
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
CVPP
VPP Capacitance
VPP = 0 V
18
25
pF
3-9
WS57C128FB
AC READ TIMING DIAGRAM
tACC
VALID
ADDRESSES
tOE
tDF
tCE
CE
OE
tOH
tDF
OUTPUTS
CAPACITANCE(6) T
A = 25 °C, f = 1 MHz
30 pF
(INCLUDING SCOPE
AND JIG
CAPACITANCE)
97.5
2.01 V
D.U.T.
A.C. TESTING INPUT/OUTPUT WAVEFORM
TEST LOAD (High Impedance Test Systems)
3.0
0.0
2.0
0.8
2.0
0.8
TEST
POINTS
NOTE: 8. Provide adequate decoupling capacitance as close as possible to this device to achieve the published A.C. and D.C. parameters.
A 0.1 microfarad capacitor in parallel with a 0.01 microfarad capacitor connected between VCC and ground is recommended.
Inadequate decoupling may result in access time degradation or other transient performance failures.
NOTES: 6. This parameter is only sampled and is not 100% tested.
7. Typical values are for TA = 25°C and nominal supply voltages.
A.C. testing inputs are driven at 3.0 V for a logic "1" and 0.0 V
for a logic "0." Timing measurements are made at 2.0 V for a
logic "1" and 0.8 V for a logic "0".
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| WS57C128FB-55D | 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:HIGH SPEED 16K x 8 CMOS EPROM |
| WS57C128FB-55DMB | 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:HIGH SPEED 16K x 8 CMOS EPROM |
| WS57C128FB-70 | 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:HIGH SPEED 16K x 8 CMOS EPROM |
| WS57C128FB-70D | 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:HIGH SPEED 16K x 8 CMOS EPROM |
| WS57C128FB-70DM | 制造商:STMICROELECTRONICS 制造商全稱(chēng):STMicroelectronics 功能描述:HIGH SPEED 16K x 8 CMOS EPROM |
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