參數(shù)資料
型號(hào): W72M64V-150BM
廠商: MICROSEMI CORP-PMG MICROELECTRONICS
元件分類: PROM
英文描述: 2M X 64 FLASH 3.3V PROM MODULE, 150 ns, PBGA159
封裝: 13 X 22 MM, 1.27 MM PITCH, PLASTIC, BGA-159
文件頁數(shù): 10/15頁
文件大?。?/td> 160K
代理商: W72M64V-150BM
4
White Electronic Designs Corporation Phoenix AZ (602) 437-1520
W72M64V-XBX
Parameter
Symbol
-100
-120
-150
Unit
Min
Max
Min
Max
Min
Max
Write Cycle Time
t AVAV
t WC
100
120
150
ns
Write Enable Setup Time
t WLEL
t WS
00
0
ns
Chip Select Pulse Width
t ELEH
t CP
45
50
ns
Address Setup Time
t AVWL
t AS
00
0
ns
Data Setup Time
t DVEH
t DS
45
50
ns
Data Hold Time
t EHDX
t DH
00
0
ns
Address Hold Time
t ELAX
t AH
45
50
ns
Chip Select Pulse Width High
t EHEL
t CPH
30
ns
Duration of Byte Programming Operation (1)
t WHWH1
300
s
Sector Erase Time (2)
t WHWH2
15
sec
Read Recovery Time Before Write (3)
t GHEL
00
0
ns
Chip Programming Time (4)
108
sec
1. Typical value for tWHWH1 is 7s.
2. Typical value for tWHWH2 is 0.7 sec.
3. Guaranteed by design, but not tested.
4. Typical value is 36 sec. The typical chip programming time is considerably less than the maximum chip programming time
listed, since most bytes program faster than the maximum program times listed.
AC CHARACTERISTICS – WRITE/ERASE/PROGRAM OPERATIONS - CS CONTROLLED
(VCC = 3.3V ± 0.3V, TA = -55°C to +125°C)
FIG 2: AC TEST CIRCUIT
AC TEST CONDITIONS
NOTES:
VZ is programmable from -2V to +7V.
IOL & IOH programmable from 0 to 16mA.
Tester Impedance Z0 = 75
.
VZ is typically the midpoint of VOH and VOL.
IOL & IOH are adjusted to simulate a typical resistive
load circuit.
ATE tester includes jig capacitance.
Parameter
Typ
Unit
Input Pulse Levels
VIL = 0, VIH = 2.5
V
Input Rise and Fall
5
ns
Input and Output Reference Level
1.5
V
Output Timing Reference Level
1.5
V
Current Source
IOL
IOH
CEFF = 50 pf
VZ
≈ 1.5V
(Bipolar Supply
D.U.T.
相關(guān)PDF資料
PDF描述
W72M64V-100BI 2M X 64 FLASH 3.3V PROM MODULE, 100 ns, PBGA159
W72M64VK100BI 2M X 64 FLASH 3.3V PROM MODULE, 100 ns, PBGA159
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W78M64110SBI 8M X 64 FLASH 3.3V PROM, 110 ns, PBGA159
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