
MOSEL VITELIC
V53C8125L
15
V53C8125L Rev. 1.4 November 1997
Fast Page Mode Operation
Fast Page Mode operation permits all 256 col-
umns within a selected row of the device to be ran-
domly accessed at a high data rate. Maintaining
RAS low while performing successive CAS cycles
retains the row address internally and eliminates the
need to reapply it for each cycle. The column ad-
dress buffer acts as a transparent or flow-through
latch while CAS is high. Thus, access begins from
the occurrence of a valid column address rather
than from the falling edge of CAS, eliminating tASC
and tT from the critical timing path. CAS latches the
address into the column address buffer and acts as
an output enable. During Fast Page Mode opera-
tion, Read, Write, Read-Modify-Write or Read-
Write-Read cycles are possible at random address-
es within a row. Following the initial entry cycle into
Fast Page Mode, access is tCAA or tCAP controlled.
If the column address is valid prior to the rising edge
of CAS, the access time is referenced to the CAS
rising edge and is specified by tCAP. If the column
address is valid after the rising CAS edge, access
is timed from the occurrence of a valid address and
is specified by tCAA. In both cases, the falling edge
of CAS latches the address and enables the output.
Fast Page Mode provides sustained data rates of
25 MHz for applications that require high data rates
such as bit-mapped graphics or high-speed signal
processing. The following equation can be used to
calculate the maximum data rate:
Data Output Operation
The V53C8125L Input/Output is controlled by
OE, CAS, WE and RAS. A RAS low transition en-
ables the transfer of data to and from the selected
row address in the Memory Array. A RAS high tran-
sition disables data transfer and latches the output
data if the output is enabled. After a memory cycle
is initiated with a RAS low transition, a CAS low
transition or CAS low level enables the internal I/O
path. A CAS high transition or a CAS high level dis-
ables the I/O path and the output driver if it is en-
abled. A CAS low transition while RAS is high has
no effect on the I/O data path or on the output driv-
ers. The output drivers, when otherwise enabled,
can be disabled by holding OE high. The OE signal
has no effect on any data stored in the output latch-
es. A WE low level can also disable the output driv-
ers when CAS is low. During a Write cycle, if WE
goes low at a time in relationship to CAS that would
normally cause the outputs to be active, it is neces-
sary to use OE to disable the output drivers prior to
the WE low transition to allow Data In Setup Time
(tDS) to be satisfied.
Power-On
After application of the VCC supply, an initial
pause of 200
s is required followed by a minimum
of 8 initialization cycles (any combination of cycles
containing a RAS clock). Eight initialization cycles
are required after extended periods of bias without
clocks (greater than the Refresh Interval).
During Power-On, the VCC current requirement of
the V53C8125L is dependent on the input levels of
RAS and CAS. If RAS is low during Power-On, the
device will go into an active cycle and ICC will exhibit
current transients. It is recommended that RAS and
CAS track with VCC or be held at a valid VIH during
Power-On to avoid current surges.
Table 1. V53C8125L Data Output
Operation for Various Cycle Types
Data Rate
256
t
RC
255
t
PC
×
+
----------------------------------------
=
Cycle Type
I/O State
Read Cycles
Data from Addressed
Memory Cell
CAS-Controlled Write
Cycle (Early Write)
High-Z
WE-Controlled Write
Cycle (Late Write)
OE Controlled. High
OE = High-Z I/Os
Read-Modify-Write
Cycles
Data from Addressed
Memory Cell
Fast Page Mode
Read
Data from Addressed
Memory Cell
Fast Page Mode Write
Cycle (Early Write)
High-Z
Fast Page Mode Read-
Modify-Write Cycle
Data from Addressed
Memory Cell
RAS-only Refresh
High-Z
CAS-before-RAS
Refresh Cycle
Data remains as in
previous cycle
CAS-only Cycles
High-Z