參數(shù)資料
型號(hào): UAA3202
廠商: NXP Semiconductors N.V.
英文描述: Frequency Shift Keying FSK receiver
中文描述: 頻移鍵控FSK接收器
文件頁(yè)數(shù): 14/24頁(yè)
文件大小: 125K
代理商: UAA3202
1997 Aug 12
14
Philips Semiconductors
Preliminary specification
Frequency Shift Keying (FSK) receiver
UAA3202M
TEST INFORMATION
Tuning procedure for AC tests
1.
2.
3.
4.
Turn on the signal generator (f
i
= 433.92 MHz; no modulation; RF input level =
60 dBm).
Tune C6 (RF stage input) to obtain a peak voltage on test point A (see Fig.11).
Turn on modulation (f
i
= 433.92 MHz; f
mod
= 250 Hz square wave;
f = 25 kHz; RF input level =
60 dBm).
Check that data is appearing on the data output (pin 11) and proceed with the AC tests.
AC test conditions
Table 2
The reference signal level P
ref
for the following tests is defined as the minimum input level in dBm to give a
BER
3
×
10
2
(e.g. 15 bit errors per second for 500 bits/s).
Test signals
Table 3
P
1
is the maximum available power from signal generator 1 at the input of the test board; P
2
is the maximum available
power from signal generator 2 at the input of the test board.
Test results
Notes
1.
2.
3.
The power-down voltage V
PWD
alternates between operating mode ON (100 ms) and OFF (100 ms); see Fig.5.
Probe of spectrum analyzer connected to test point A.
Spectrum analyzer connected to the input of the test board.
TEST
SIGNAL
FREQUENCY
(MHz)
DATA SIGNAL
MODULATION
FREQUENCY
DEVIATION
1
2
3
433.92
433.92
433.82
250 Hz square wave
FM (FSK)
no modulation
no modulation
25 kHz
TEST
GENERATOR
RESULT
1
2
Sensitivity into pin MXIN
(see Fig.6)
Maximum input power
(see Fig.6)
modulated test
signal 1; P
1
94 dBm
modulated test
signal 1; P
1
30 dBm
(minimum P
max
)
test signal 1;
P
1
= P
ref
+ 10 dB
BER
3
×
10
2
(e.g. 15 bit errors per second for 500 bits/s)
BER
3
×
10
2
(e.g. 15 bit errors per second for 500 bits/s)
Receiver turn-on time; note 1
check that the first 10 bits are correct; error
counting is started 10 ms after PWD
switched to operating mode: ON
IP3 = P
1
+
1
2
×
IM3 (dB); IP3
38 dBm
Intercept point (mixer + PMA)
see note 2 and Fig.7
Spurious radiation see note 3
and Fig.8
test signal 3;
P
1
=
55 dBm
test signal 2;
P
2
= P
1
no spurious radiation (25 MHz
1 GHz)
with level higher than
60 dBm
(maximum P
spur
)
(P
o1
+ 70 dB)
[P
o2
+ 45 dB (minimum
P
1 dB
)]
1 dB, where P
o1
, P
o2
is the output
power for test signals with P
11
or P
12
,
respectively
1 dB compression point
(mixer + PMA) see note 2
and Fig.9
test signal 3;
P
11
=
70 dBm;
P
12
=
45 dBm
(minimum P
1dB
)
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