
TC241
780-
×
488-PIXEL CCD IMAGE SENSOR
SOCS006C – AUGUST 1986 – REVISED DECEMBER 1991
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating ranges of supply voltage and operating
free-air temperature (unless otherwise noted)
PARAMETER
MIN
TYP
MAX
UNIT
Dynamic range (see Note 2)
Antiblooming disabled (see Note 3)
60
dB
μ
V/e
Charge-conversion factor
1.4
1.6
1.8
Charge-transfer efficiency (see Note 4)
Signal-response delay time,
τ
(see Note 5 and Figure 11)
Gamma (see Note 6)
0.9999
0.99995
18
20
22
ns
0.97
0.98
Output resistance
700
800
Noise voltage
1/f noise (5 kHz)
0.13
μ
V/
√
Hz
Random noise (f = 100 kHz)
0.11
Noise-equivalent signal
120
electrons
ADB (see Note 7)
20
Rejection ratio at 4.77 MHz
SRG1, SRG2, SRG3 (see Note 8)
40
dB
ABG (see Note 9)
20
Supply current
5
mA
IAG
12000
SRG1, SRG2, SRG3
120
Input capacitance, Ci
ABG
4000
pF
TRG
350
SAG
14000
All typical values are at TA = 25
°
C
NOTES:
2. Dynamic range is –20 times the logarithm of the mean-noise signal divided by the saturation-output signal.
3. For this test, the antiblooming gate must be biased at the intermediate level.
4. Charge-transfer efficiency is one minus the charge loss per transfer in the output register. The test is performed in the dark using
an electrical input signal.
5. Signal-response delay time is the time between the falling edge of the SRG clock pulse and the output-signal valid state.
6. Gamma (
γ
) is the value of the exponent in the equation below for two points on the linear portion of the transfer-function curve (this
value represents points near saturation):
Exposure (2)
Exposure (1)
Output signal (2)
Output signal (1)
7. ADB rejection ratio is –20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ADB.
8. SRGn rejection ratio is –20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at SRGn.
9. ABG rejection ratio is –20 times the logarithm of the ac amplitude at the output divided by the ac amplitude at ABG.