參數(shù)資料
型號(hào)： TIBPAL22V10-20MJT
廠商： Texas Instruments, Inc.
英文描述： HIGH-PERFORMANCE IMPACT-X E PROGRAMMABLE ARRAY LOGIC CIRCUITS
中文描述： 高性能的影響x電子可編程陣列邏輯電路
文件頁數(shù)： 9/17頁
文件大小： 164K
代理商： TIBPAL22V10-20MJT
IIL
VCC = 5.5 V,
VI = 0.4 V
mA
TIBPAL22V10-20M
HIGH-PERFORMANCE
IMPACT-X
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS012A – D3523, JUNE 1990 – REVISED MARCH 1992
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
9
electrical characteristics over recommended operating free-air temperature range
PARAMETER
TEST CONDITIONS
II = –18 mA
IOH = –2 mA
IOL = 12 mA
VO = 2.7 V
VO = 0.4 V
VI = 5.5 V
VI = 2.7 V
MIN
TYP
MAX
–1.2
UNIT
V
V
V
mA
mA
mA
μ
A
VIK
VOH
VOL
IOZH
IOZL
II
IIH
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 4.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
VCC = 5.5 V,
2.4
3.5
0.25
0.5
0.1
–0.1
1
25
CLK
All others
–0.2
–0.1
IOS
ICC
Ci
Co
Cclk
All typical values are at VCC = 5 V, TA = 25
°
C.
Not more than one output should be shorted at a time, and the duration of the short circuit should not exceed one second. VO is set at 0.5 V to
avoid test problems caused by test equipment ground degradation.
VCC = 5.5 V,
VCC = 5.5 V,
f = 1 MHz,
f = 1 MHz,
f = 1 MHz,
VO = 0.5 V
VI = GND,
VI = 2 V
VO = 2 V
VCLK = 2 V
–30
–90
200
mA
mA
pF
pF
pF
Outputs open
5.5
8
7
switching characteristics
over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted)
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
TEST CONDITION
MIN
MAX
UNIT
fmax§
tpd
tpd
tpd
ten
tdis
External feedback
I, I/O
I, I/O (reset)
CLK
I, I/O
I, I/O
33.3
MHz
ns
ns
ns
ns
ns
I/O
Q
Q
I/O, Q
I/O, Q
R1 = 390
,
R2 = 750
,
See Figure 4
20
25
15
20
20
§fmax (with feedback) =
tsu
tp1
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