參數(shù)資料
型號(hào)： TIBPAL22V10-20MJT
廠商： Texas Instruments, Inc.
英文描述： HIGH-PERFORMANCE IMPACT-X E PROGRAMMABLE ARRAY LOGIC CIRCUITS
中文描述： 高性能的影響x電子可編程陣列邏輯電路
文件頁(yè)數(shù)： 10/17頁(yè)
文件大?。?/td> 164K
代理商： TIBPAL22V10-20MJT
TIBPAL22V10-20M
HIGH-PERFORMANCE
IMPACT-X
PROGRAMMABLE ARRAY LOGIC CIRCUITS
SRPS012A – D3523, JUNE 1990 – REVISED MARCH 1992
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
10
preload procedure for registered outputs (see Notes 2 and 3)
The output registers can be preloaded to any desired state during device testing. This permits any state to be
tested without having to step through the entire state-machine sequence. Each register is preloaded individually
by following the steps given below:
Step 1. With V
CC
at 5 V and pin 1 at V
IL
, raise pin 13 to V
IHH
.
Step 2. Apply either V
IL
or V
IH
to the output corresponding to the register to be preloaded.
Step 3. Pulse pin 1, clocking in preload data.
Step 4. Remove output voltage, then lower pin 13 to V
IL
. Preload can be verified by observing the voltage level
at the output pin.
td
tsu
tw
td
VIHH
VIL
VIL
VOL
VOH
VIH
Pin 13
Pin 1
Registered I/O
Input
Output
VIH
VIL
Figure 2. Preload Waveforms
NOTES: 2. Pin numbers shown are for the JT package only. If chip-carrier socket adapter is not used, pin numbers must be changed accordingly.
3.
t
d =
t
su =
t
w
= 100 ns to 1000 ns.
V
IHH
= 10.25 V to 10.75 V.
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