參數(shù)資料
型號(hào): TC94A23F
廠商: Toshiba Corporation
英文描述: Single-chip CD Processor with Built-in Controller
中文描述: 單芯片的CD處理器的控制器,內(nèi)置
文件頁(yè)數(shù): 16/20頁(yè)
文件大小: 219K
代理商: TC94A23F
TC94A23F
2002-02-06
16
LCD common output/output port
(COM1/OT1 to COM4/OT4)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
I
OH1
V
OH
4.5 V (LCD output)
200
600
A
High level
I
OH2
V
OH
4.5 V (OT output)
15
30
mA
I
OL1
V
OL
0.5 V (LCD output)
200
600
A
Output current
Low level
I
OL5
V
OL
0.5 V (OT output)
4.0
10
mA
1/2 level
V
BS2
No load (LCD output, 1/2 bias method set)
2.3
2.5
2.7
1/3 level
V
BS1
1.47
1.67
1.87
Bias voltage
2/3 level
V
BS3
No load (LCD output, 1/3 bias method set)
3.13
3.33
3.53
V
Segment output, output ports, I/O ports, and CD function output
(S1/OT4 to S9/OT13, S10/OT14/ZDET to S14/OT18/LRCK, P8-0/S14/BCK to P8-3/S18/IPF, OT19)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
I
OH1
V
OH
4.5 V (LCD output)
200
600
A
High level
I
OH4
V
OH
4.5 V (OT output, CD output,
excluding P8-0 to P8-3 pins)
1.5
4.0
mA
I
OL1
V
OL
0.5 V (LCD output)
200
600
A
Output current
Low level
I
OL5
V
OL
0.5 V (OT output, CD output)
4.0
10
mA
Input leakage current
I
LI
V
IH
5.0 V, V
IL
0 V (P8-0~P8-3)
1.0
A
High level
V
IH
(P8-0~P8-3, CLCK)
MV
DD
0.8
~
MV
DD
Input voltage
Low level
V
IL
(P8-0~P8-3, CLCK)
0
~
MV
DD
0.2
V
1/3 level
V
BS1
1.47
1.67
1.87
Bias voltage
1/2 level
V
BS3
No load (LCD output, 1/3 bias method set)
3.13
3.33
3.53
V
I/O port
(P1-0~P4-3)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
High level
I
OH3
V
OH
4.5 V
0.8
2.0
I
OL3
V
OL
0.5 V
(excluding P4-1, P4-2, P4-3 pins)
1.0
3.0
Output current
Low level
I
OL5
V
OL
0.5 V (P4-1, P4-2, P4-3 pins)
4.0
10
mA
Input leakage current
I
LI
V
IH
5.0 V, V
IL
0 V
1.0
A
High level
V
IH
MV
DD
0.8
~
MV
DD
Input voltage
Low level
V
IL
0
~
MV
DD
0.2
V
Input pull-up/down resistance
R
IN1
(P1-0 to P1-3 pins) pull-down/up set
25
50
120
k
HOLD
, INTR input port, RST
RST
input,
1-bit DAC data input
(EMPHin/
HSOin/LRCKin/DATAin/BCKin)
Input port
(IN1/IN2)
Characteristic
Symbol
Test
Circuit
Test Condition
Min
Typ.
Max
Unit
Input leakage current
I
LI
V
IH
5.0 V, V
IL
0 V
1.0
A
High level
V
IH
MV
DD
0.8
~
MV
DD
Input voltage
Low level
V
IL
0
~
MV
DD
0.2
V
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