參數(shù)資料
型號(hào)： TAS5186DKD
廠(chǎng)商： Texas Instruments, Inc.
英文描述： 6-Channel, 210-W, Digital-Amplifier Power Stage
中文描述： 6通道，210鎢，數(shù)字放大器功率級(jí)
文件頁(yè)數(shù)： 4/17頁(yè)
文件大?。?/td> 349K
代理商： TAS5186DKD
www.ti.com
PACKAGE HEAT DISSIPATION RATINGS
(1)
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)
(1)
TAS5186
SLES136–MAY 2005
Table 1. MODE Selection Pins
MODE PINS
(1)
M2
0
0
1
MODE
M3
0
1
0/1
NAME
DESCRIPTION
2.1 mode
5.1 mode
Reserved
Channels A, B, and C enabled; channels D, E, and F disabled
All channels enabled
(1)
M1 must always be connected to ground. 0 indicates a pin connected to GND; 1 indicates a pin connected to VREG.
PARAMETER
TAS5186DDV
10.3
5.2
5.2
2.6
1.74
34.9 mm
2
R
θ
JC
(
°
C/W)—1 satellite (sat.) FET only
R
θ
JC
(
°
C/W)—1 subwoofer (sub.) FET only
R
θ
JC
(
°
C/W)—1 sat. half-bridge
R
θ
JC
(
°
C/W)—1 sub. half-bridge
R
θ
JC
(
°
C/W)—5 sat. half-bridges + 1 sub.
Typical pad area
(2)
(1)
(2)
JC is junction-to-case, CH is case-to-heatsink.
R
θ
CH
is an important consideration. Assume a 2-mil thickness of typical thermal grease between the pad area and the heatsink. The
R
θ
CH
with this condition is typically 2°C/W for this package.
TAS5186
VDD to AGND
GVDD_X to AGND
PVDD_X to PGND_X
(2)
OUT_X to PGND_X
(2)
BST_X to PGND_X
(2)
VREG to AGND
PGND_X to GND
PGND_X to AGND
GND to AGND
PWM_X, OC_ADJ, M1, M2, M3 to AGND
RESET, SD, OTW to AGND
Maximum operating junction temperature range (T
J
)
Storage temperature
Lead temperature – 1,6 mm (1/16 inch) from case for 10 seconds
Minimum PWM pulse duration, low
–0.3 V to 13.2 V
–0.3 V to 13.2 V
–0.3 V to 50 V
–0.3 V to 50 V
–0.3 V to 63.2 V
–0.3 V to 4.2 V
–0.3 V to 0.3 V
–0.3 V to 0.3 V
–0.3 V to 0.3 V
–0.3 V to 4.2 V
–0.3 V to 7 V
0 to 125°C
–40°C to 125°C
260°C
30 ns
(1)
Stresses beyond those listed under
absolute maximum ratings
may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under
recommended operating
conditions
is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
These voltages represent the dc voltage + peak ac waveform measured at the terminal of the device in all conditions.
(2)
4
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