參數(shù)資料
型號: SSTUA32866EC,557
廠商: NXP SEMICONDUCTORS
元件分類: 鎖存器
英文描述: 32866 SERIES, POSITIVE EDGE TRIGGERED D FLIP-FLOP, COMPLEMENTARY OUTPUT, PBGA96
封裝: 13.50 X 5.50 MM, 1.05 MM HEIGHT, PLASTIC, SOT-536-1, LFBGA-96
文件頁數(shù): 8/28頁
文件大小: 153K
代理商: SSTUA32866EC,557
SSTUA32866_2
NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 02 — 26 March 2007
16 of 28
NXP Semiconductors
SSTUA32866
1.8 V DDR2-667 congurable registered buffer with parity
11. Test information
11.1 Parameter measurement information for data output load circuit
VDD = 1.8 V ± 0.1 V.
All input pulses are supplied by generators having the following characteristics:
PRR
≤ 10 MHz; Z
0 =50 ; input slew rate = 1 V/ns ± 20 %, unless otherwise specied.
The outputs are measured one at a time with one transition per measurement.
(1) CL includes probe and jig capacitance.
Fig 10. Load circuit, data output measurements
(1) IDD tested with clock and data inputs held at VDD or GND, and IO = 0 mA.
Fig 11. Voltage and current waveforms; inputs active and inactive times
VID = 600 mV
VIH =Vref + 250 mV (AC voltage levels) for differential inputs. VIH =VDD for LVCMOS inputs.
VIL =Vref 250 mV (AC voltage levels) for differential inputs. VIL = GND for LVCMOS inputs.
Fig 12. Voltage waveforms; pulse duration
RL = 100
RL = 1000
VDD
50
CK inputs
CK
OUT
DUT
test point
002aaa371
test point
delay = 350 ps
Zo = 50
RL = 1000
CL = 30 pF(1)
LVCMOS
RESET
10 %
IDD(1)
tINACT
VDD
0.5VDD
tACT
90 %
0 V
002aaa372
0.5VDD
VICR
VIH
VIL
input
tW
VID
002aaa373
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