參數(shù)資料
型號(hào): SN74LVC3G14YEPR
廠商: TEXAS INSTRUMENTS INC
元件分類: 門(mén)電路
英文描述: LVC/LCX/Z SERIES, TRIPLE 1-INPUT INVERT GATE, BGA8
封裝: DSBGA-8
文件頁(yè)數(shù): 1/15頁(yè)
文件大?。?/td> 385K
代理商: SN74LVC3G14YEPR
www.ti.com
FEATURES
Seemechanicaldrawingsfordimensions.
DCTPACKAGE
(TOP VIEW)
DCUPACKAGE
(TOP VIEW)
YEA, YEP, YZA,
OR YZP PACKAGE
(BOTTOMVIEW)
1
V
CC
8
1A
2
7
3Y
1Y
3
6
2A
3A
4
5
GND
2Y
3
6
3A
2A
8
1
V
CC
1A
5
GND
4
2Y
2
7
1Y
3Y
GND
5
4
2Y
3 6
3A
2A
2 7
1Y
3Y
8
V
CC
1
1A
DESCRIPTION/ORDERING INFORMATION
TRIPLE SCHMITT-TRIGGER INVERTER
SCES367H – AUGUST 2001 – REVISED SEPTEMBER 2006
Available in the Texas Instruments
I
off Feature Supports Partial-Power-Down
NanoStar and NanoFree Packages
Mode Operation
Supports 5-V V
CC Operation
Latch-Up Performance Exceeds 100 mA Per
JESD 78, Class II
Inputs Accept Voltages to 5.5 V
ESD Protection Exceeds JESD 22
Max t
pd of 5.4 ns at 3.3 V
– 2000-V Human-Body Model (A114-A)
Low Power Consumption, 10-
A Max I
CC
– 200-V Machine Model (A115-A)
±24-mA Output Drive at 3.3 V
– 1000-V Charged-Device Model (C101)
Typical V
OLP (Output Ground Bounce) <0.8 V
at V
CC = 3.3 V, TA = 25°C
Typical V
OHV (Output VOH Undershoot) >2 V at
V
CC = 3.3 V, TA = 25°C
This triple Schmitt-trigger inverter is designed for 1.65-V to 5.5-V VCC operation.
The SN74LVC3G14 contains three inverters and performs the Boolean function Y = A. The device functions as
three independent inverters but, because of Schmitt action, it may have different input threshold levels for
positive-going (VT+) and negative-going (VT–) signals.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
NanoStar, NanoFree are trademarks of Texas Instruments.
PRODUCTION DATA information is current as of publication date.
Copyright 2001–2006, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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