參數(shù)資料
型號(hào)： SN74BCT8374ANT
廠商： TEXAS INSTRUMENTS INC
元件分類(lèi)： 總線收發(fā)器
英文描述： BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24
封裝： PLASTIC, DIP-24
文件頁(yè)數(shù)： 6/26頁(yè)
文件大?。?/td> 530K
代理商： SN74BCT8374ANT
SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
14
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing description
All test operations of the ’BCT8374A are synchronous to TCK. Data on the TDI, TMS, and normal-function inputs
is captured on the rising edge of TCK. Data appears on the TDO and normal-function output terminals on the
falling edge of TCK. The TAP controller is advanced through its states (as shown in Figure 1) by changing the
value of TMS on the falling edge of TCK and then applying a rising edge to TCK.
A simple timing example is shown in Figure 8. In this example, the TAP controller begins in the Test-Logic-Reset
state and is advanced through its states as necessary to perform one instruction-register scan and one
data-register scan. While in the Shift-IR and Shift-DR states, TDI is used to input serial data and TDO is used
to output serial data. The TAP controller is then returned to the Test-Logic-Reset state. Table 4 explains the
operation of the test circuitry during each TCK cycle.
Table 4. Explanation of Timing Example
TCK
CYCLE(S)
TAP STATE
AFTER TCK
DESCRIPTION
1
Test-Logic-Reset
TMS is changed to a logic 0 value on the falling edge of TCK to begin advancing the TAP controller toward
the desired state.
2
Run-Test/Idle
3
Select-DR-Scan
4
Select-IR-Scan
5
Capture-IR
The IR captures the 8-bit binary value 10000001 on the rising edge of TCK as the TAP controller exits the
Capture-IR state.
6
Shift-IR
TDO becomes active and TDI is made valid on the falling edge of TCK. The first bit is shifted into the TAP
on the rising edge of TCK as the TAP controller advances to the next state.
7–13
Shift-IR
One bit is shifted into the IR on each TCK rising edge. With TDI held at a logic 1 value, the 8-bit binary value
11111111 is serially scanned into the IR. At the same time, the 8-bit binary value 10000001 is serially scanned
out of the IR via TDO. In TCK cycle 13, TMS is changed to a logic 1 value to end the IR scan on the next
TCK cycle. The last bit of the instruction is shifted as the TAP controller advances from Shift-IR to Exit1-IR.
14
Exit1-IR
TDO becomes inactive (goes to the high-impedance state) on the falling edge of TCK.
15
Update-IR
The IR is updated with the new instruction (BYPASS) on the falling edge of TCK.
16
Select-DR-Scan
17
Capture-DR
The bypass register captures a logic 0 value on the rising edge of TCK as the TAP controller exits the
Capture-DR state.
18
Shift-DR
TDO becomes active and TDI is made valid on the falling edge of TCK. The first bit is shifted into the TAP
on the rising edge of TCK as the TAP controller advances to the next state.
19–20
Shift-DR
The binary value 101 is shifted in via TDI, while the binary value 010 is shifted out via TDO.
21
Exit1-DR
TDO becomes inactive (goes to the high-impedance state) on the falling edge of TCK.
22
Update-DR
In general, the selected data register is updated with the new data on the falling edge of TCK.
23
Select-DR-Scan
24
Select-IR-Scan
25
Test-Logic-Reset
Test operation completed
相關(guān)PDF資料
PDF描述
SN74CB3Q16210DGVR CB3Q/3VH/3C/2B SERIES, DUAL 10-BIT DRIVER, TRUE OUTPUT, PDSO48
SN74CB3Q16811DLR CB3Q/3VH/3C/2B SERIES, DUAL 12-BIT DRIVER, TRUE OUTPUT, PDSO56
SN74CB3Q3244GQNR CB3Q/3VH/3C/2B SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, PBGA20
SN74CB3Q3244ZQNR CB3Q/3VH/3C/2B SERIES, DUAL 4-BIT DRIVER, TRUE OUTPUT, PBGA20
SN74CB3Q3245PWG4 CB3Q/3VH/3C/2B SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20
相關(guān)代理商/技術(shù)參數(shù)
參數(shù)描述
SN74BCT8374ANTE4 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74BCT8374NT 制造商:Texas Instruments 功能描述:Flip Flop, Octal, D Type, 24 Pin, Plastic, DIP
SN74BCT899DW 制造商:Texas Instruments 功能描述:
SN74CB373384DBQR 制造商:Texas Instruments 功能描述:
SN74CB3Q16210DGGR 功能描述:數(shù)字總線開(kāi)關(guān) IC Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 開(kāi)關(guān)數(shù)量:24 傳播延遲時(shí)間:0.25 ns 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:TSSOP-56 封裝:Reel
發(fā)布緊急采購(gòu)，3分鐘左右您將得到回復(fù)。

采購(gòu)需求

(若只采購(gòu)一條型號(hào)，填寫(xiě)一行即可)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

發(fā)布成功！您可以繼續(xù)發(fā)布采購(gòu)。也可以進(jìn)入我的后臺(tái)，查看報(bào)價(jià)

*型號(hào) *數(shù)量 廠商 批號(hào) 封裝
添加更多采購(gòu)

我的聯(lián)系方式

*
*
*