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參數(shù)資料
| 型號(hào)： | SN74BCT8374ANT |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDIP24 |
| 封裝： | PLASTIC, DIP-24 |
| 文件頁數(shù)： | 22/26頁 |
| 文件大?。?/td> | 530K |
| 代理商： | SN74BCT8374ANT |
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SN54BCT8374A, SN74BCT8374A
SCAN TEST DEVICES
WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SCBS045E – JUNE 1990 – REVISED JULY 1996
5
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
test architecture
Serial-test information is conveyed by means of a 4-wire test bus, or TAP, that conforms to IEEE Standard
1149.1-1990. Test instructions, test data, and test control signals all are passed along this serial-test bus. The
TAP controller monitors two signals from the test bus, TCK and TMS. The TAP controller extracts the
synchronization (TCK) and state control (TMS) signals from the test bus and generates the appropriate on-chip
control signals for the test structures in the device. Figure 1 shows the TAP-controller state diagram.
The TAP controller is fully synchronous to the TCK signal. Input data is captured on the rising edge of TCK, and
output data changes on the falling edge of TCK. This scheme ensures that data to be captured is valid for fully
one-half of the TCK cycle.
The functional block diagram shows the IEEE Standard 1149.1-1990 4-wire test bus and boundary-scan
architecture and the relationship among the test bus, the TAP controller, and the test registers. As shown, the
device contains an 8-bit instruction register and three test-data registers: an 18-bit boundary-scan register, a
2-bit boundary-control register, and a 1-bit bypass register.
Test-Logic-Reset
Run-Test /Idle
Select-DR-Scan
Capture-DR
Shift-DR
Exit1-DR
Pause-DR
Update-DR
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-DR
Select-IR-Scan
Capture-IR
Shift-IR
Exit1-IR
Pause-IR
Update-IR
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
Exit2-IR
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
TMS = H
TMS = L
Figure 1. TAP-Controller State Diagram
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| SN74BCT8374ANTE4 | 功能描述:特定功能邏輯 Device w/Octal D-Typ Edge-Trig Flip-Flop RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
| SN74BCT8374NT | 制造商:Texas Instruments 功能描述:Flip Flop, Octal, D Type, 24 Pin, Plastic, DIP |
| SN74BCT899DW | 制造商:Texas Instruments 功能描述: |
| SN74CB373384DBQR | 制造商:Texas Instruments 功能描述: |
| SN74CB3Q16210DGGR | 功能描述:數(shù)字總線開關(guān) IC Fixed LDO Volt Reg RoHS:否 制造商:Texas Instruments 開關(guān)數(shù)量:24 傳播延遲時(shí)間:0.25 ns 最大工作溫度:+ 85 C 最小工作溫度:- 40 C 封裝 / 箱體:TSSOP-56 封裝:Reel |
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