參數(shù)資料
型號: SN74ABT8952DW
廠商: Texas Instruments
文件頁數(shù): 14/31頁
文件大?。?/td> 0K
描述: IC SCAN-TEST-DEV/XCVR 28-SOIC
標(biāo)準(zhǔn)包裝: 20
系列: 74ABT
邏輯類型: 掃描測試設(shè)備,帶寄存總線收發(fā)器
電源電壓: 4.5 V ~ 5.5 V
位數(shù): 8
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 28-SOIC(0.295",7.50mm 寬)
供應(yīng)商設(shè)備封裝: 28-SOIC
包裝: 管件
產(chǎn)品目錄頁面: 925 (CN2011-ZH PDF)
其它名稱: 296-4116-5
SN54ABT8952, SN74ABT8952
SCAN TEST DEVICES WITH
OCTAL REGISTERED BUS TRANSCEIVERS
SCBS121D – AUGUST 1992 – REVISED JULY 1996
21
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (normal mode) (see Figure 13)
SN54ABT8952
SN74ABT8952
UNIT
MIN
MAX
MIN
MAX
UNIT
fclock
Clock frequency
CLKAB or CLKBA
0
100
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
3
ns
t
Setup time
A before CLKAB
↑ or B before CLKBA↑
4.5
ns
tsu
Setup time
CLKEN before CLK
4.5
ns
th
Hold time
A after CLKAB
↑ or B after CLKBA↑
0
ns
th
Hold time
CLKEN after CLK
0
ns
timing requirements over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (test mode) (see Figure 13)
SN54ABT8952
SN74ABT8952
UNIT
MIN
MAX
MIN
MAX
UNIT
fclock
Clock frequency
TCK
0
50
0
50
MHz
tw
Pulse duration
TCK high or low
5
ns
A, B, CLK, CLKEN, or OE before TCK
5
tsu
Setup time
TDI before TCK
6
ns
TMS before TCK
6
A, B, CLK, CLKEN, or OE after TCK
0
th
Hold time
TDI after TCK
0
ns
TMS after TCK
0
td
Delay time
Power up to TCK
50*
50
ns
tr
Rise time
VCC power up
1*
1
s
*On products compliant to MIL-PRF-38535, this parameter is not production tested.
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
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