參數(shù)資料
型號： SN74ABT8652DW
廠商： TEXAS INSTRUMENTS INC
元件分類： 總線收發(fā)器
英文描述： ABT SERIES, 8-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PDSO28
封裝： PLASTIC, SOIC-28
文件頁數(shù)： 3/30頁
文件大?。?/td> 506K
代理商： SN74ABT8652DW
SN54ABT8652, SN74ABT8652
SCAN TEST DEVICES
WITH OCTAL BUS TRANSCEIVERS AND REGISTERS
SCBS122F – AUGUST 1992 – REVISED DECEMBER 1996
11
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
thereby reducing the number of bits per test pattern that must be applied to complete a test operation.
During Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in
Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
instruction-register opcode description
The instruction-register opcodes are shown in Table 3. The following descriptions detail the operation of
each instruction.
Table 3. Instruction-Register Opcodes
BINARY CODE
BIT 7
→ BIT 0
MSB
→ LSB
SCOPE OPCODE
DESCRIPTION
SELECTED DATA
REGISTER
MODE
00000000
EXTEST/INTEST
Boundary scan
Test
10000001
BYPASS
Bypass scan
Bypass
Normal
10000010
SAMPLE/PRELOAD
Sample boundary
Boundary scan
Normal
00000011
INTEST/EXTEST
Boundary scan
Test
10000100
BYPASS
Bypass scan
Bypass
Normal
00000101
BYPASS
Bypass scan
Bypass
Normal
00000110
HIGHZ
Control boundary to high impedance
Bypass
Modified test
10000111
CLAMP
Control boundary to 1/0
Bypass
Test
10001000
BYPASS
Bypass scan
Bypass
Normal
00001001
RUNT
Boundary run test
Bypass
Test
00001010
READBN
Boundary read
Boundary scan
Normal
10001011
READBT
Boundary read
Boundary scan
Test
00001100
CELLTST
Boundary self test
Boundary scan
Normal
10001101
TOPHIP
Boundary toggle outputs
Bypass
Test
10001110
SCANCN
Boundary-control register scan
Boundary control
Normal
00001111
SCANCT
Boundary-control register scan
Boundary control
Test
All others
BYPASS
Bypass scan
Bypass
Normal
Bit 7 is used to maintain even parity in the 8-bit instruction.
The BYPASS instruction is executed in lieu of a SCOPE
instruction that is not supported in the ’ABT8652.
boundary scan
This instruction conforms to the IEEE Standard 1149.1-1990 EXTEST and INTEST instructions. The BSR is
selected in the scan path. Data appearing at the device input terminals is captured in the input BSCs, while data
appearing at the outputs of the normal on-chip logic is captured in the output BSCs. Data that has been scanned
into the input BSCs is applied to the inputs of the normal on-chip logic, while data that has been scanned into
the output BSCs is applied to the device output terminals. The device operates in the test mode.
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相關代理商/技術參數(shù)
參數(shù)描述
SN74ABT8652DWE4 功能描述:特定功能邏輯 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8652DWG4 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8652DWR 功能描述:總線收發(fā)器 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Fairchild Semiconductor 邏輯類型:CMOS 邏輯系列:74VCX 每芯片的通道數(shù)量:16 輸入電平:CMOS 輸出電平:CMOS 輸出類型:3-State 高電平輸出電流:- 24 mA 低電平輸出電流:24 mA 傳播延遲時間:6.2 ns 電源電壓-最大:2.7 V, 3.6 V 電源電壓-最小:1.65 V, 2.3 V 最大工作溫度:+ 85 C 封裝 / 箱體:TSSOP-48 封裝:Reel
SN74ABT8652DWRE4 功能描述:特定功能邏輯 Device w/Octal Bus Trnscvr & Register RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
SN74ABT8652DWRG4 功能描述:特定功能邏輯 Scan Test Devices RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube
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