- 您現(xiàn)在的位置：買賣IC網(wǎng) > PDF目錄98089 > SN54LVTH182512HKC (TEXAS INSTRUMENTS INC) LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64 PDF資料下載
參數(shù)資料
| 型號： | SN54LVTH182512HKC |
| 廠商： | TEXAS INSTRUMENTS INC |
| 元件分類： | 總線收發(fā)器 |
| 英文描述： | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64 |
| 封裝： | 0.50 MM PITCH, CERAMIC, FP-64 |
| 文件頁數(shù)： | 34/34頁 |
| 文件大?。?/td> | 518K |
| 代理商： | SN54LVTH182512HKC |
第1頁第2頁第3頁第4頁第5頁第6頁第7頁第8頁第9頁第10頁第11頁第12頁第13頁第14頁第15頁第16頁第17頁第18頁第19頁第20頁第21頁第22頁第23頁第24頁第25頁第26頁第27頁第28頁第29頁第30頁第31頁第32頁第33頁當(dāng)前第34頁
SN54LVTH18512, SN54LVTH182512, SN74LVTH18512, SN74LVTH182512
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS671B – AUGUST 1996 – REVISED OCTOBER 1997
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 48 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function I/O pin (one single cell for both input data and
output data). The BSR is used to store test data that is to be applied externally to the device output pins, and/or
to capture data that appears internally at the outputs of the normal on-chip logic and/or externally at the device
input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test /Idle as determined by the current instruction. At power up or
in Test-Logic-Reset, BSCs 47–44 are reset to logic 1, ensuring that these cells, which control A-port and B-port
outputs are set to benign values (i.e., if test mode were invoked, the outputs would be at the high-impedance
state). Reset values of other BSCs should be considered indeterminate.
The BSR order of scan is from TDI through bits 47–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
47
2OEAB
35
2A9-I/O
17
2B9-I/O
46
1OEAB
34
2A8-I/O
16
2B8-I/O
45
2OEBA
33
2A7-I/O
15
2B7-I/O
44
1OEBA
32
2A6-I/O
14
2B6-I/O
43
2CLKAB
31
2A5-I/O
13
2B5-I/O
42
1CLKAB
30
2A4-I/O
12
2B4-I/O
41
2CLKBA
29
2A3-I/O
11
2B3-I/O
40
1CLKBA
28
2A2-I/O
10
2B2-I/O
39
2LEAB
27
2A1-I/O
9
2B1-I/O
38
1LEAB
26
1A9-I/O
8
1B9-I/O
37
2LEBA
25
1A8-I/O
7
1B8-I/O
36
1LEBA
24
1A7-I/O
6
1B7-I/O
––
23
1A6-I/O
5
1B6-I/O
––
22
1A5-I/O
4
1B5-I/O
––
21
1A4-I/O
3
1B4-I/O
––
20
1A3-I/O
2
1B3-I/O
––
19
1A2-I/O
1
1B2-I/O
––
18
1A1-I/O
0
1B1-I/O
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SN54LVTH182516HKC | LVT SERIES, 18-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64 |
| SNJ54LVTH18516HKC | LVT SERIES, 18-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64 |
| SNJ54LVTH182516HKC | LVT SERIES, 18-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CDFP64 |
| SN54LVTH182646AHV | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 |
| SN54LVTH182652AHV | LVT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, CQFP68 |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
發(fā)布緊急采購，3分鐘左右您將得到回復(fù)。