
DEVICE SELECTION GUIDE
IEEE STD 1149.1 (JTAG) BOUNDARY SCAN LOGIC
5–99
DEVICE
NO.
PINS
DESCRIPTION
AVAILABILITY
LITERATURE
REFERENCE
DEVICE
NO.
PINS
DESCRIPTION
MIL
PDIP
PLCC
SOIC
SSOP
TQFP
TSSOP
LITERATURE
REFERENCE
SN74BCT8240A
24
Scan Test Devices with Octal Buffers
SCBS067
SN74BCT8244A
24
Scan Test Devices with Octal Buffers
SCBS042
SN74ABT8245
24
Scan Test Devices with Octal Transceivers
SCBS124
SN74BCT8245A
24
Scan Test Devices with Octal Transceivers
SCBS043
SN74BCT8373A
24
Scan Test Devices with Octal D-Type Latches
SCBS044
SN74BCT8374A
24
Scan Test Devices with Octal Edge-Triggered D-Type Flip-Flops
SCBS045
SN74ABT8543
28
Scan Test Devices with Octal Registered Bus Transceivers
SCBS120
SN74ABT8646
28
Scan Test Devices with Octal Bus Transceivers and Registers
SCBS123
SN74ABT8652
28
Scan Test Devices with Octal Bus Transceivers and Registers
SCBS122
SN74ABT8952
28
Scan Test Devices with Octal Registered Bus Transceivers
SCBS121
SN74LVT8980
24
Scan Test Bus Controllers with 8-Bit Generic Host Interfaces
SCBS676
SN74ACT8990
44
Test Bus Controllers IEEE Std 1149.1 (JTAG) TAP Masters
with 16-Bit Generic Host Interfaces
SCBS190
SN74ABT8996
24
10-Bit Addressable Scan Ports Multidrop-Addressable
IEEE Std 1149.1 (JTAG) TAP Transceivers
SCBS489
SN74LVT8996
24
10-Bit Addressable Scan Ports Multidrop-Addressable
IEEE Std 1149.1 (JTAG) TAP Transceivers
SCBS686
SN74ACT8997
28
Scan Path Linkers with 4-Bit Identification Buses
Scan-Controlled IEEE Std 1149.1 (JTAG) TAP Concatenators
SCBS157
SN74ABT18245A
56
Scan Test Devices with 18-Bit Bus Transceivers
SCBS110
SN74ABT18502
64
Scan Test Devices with 18-Bit Universal Bus Transceivers
SCBS109
SN74ABTH18502A
64
Scan Test Devices with 18-Bit Universal Bus Transceivers
SCBS164
SN74LVTH18502A
64
Scan Test Devices with 18-Bit Universal Bus Transceivers
SCBS668
SN74ABT18504
64
Scan Test Devices with 20-Bit Universal Bus Transceivers
SCBS108
SN74ABTH18504A
64
Scan Test Devices with 20-Bit Universal Bus Transceivers
SCBS165
SN74LVTH18504A
64
Scan Test Devices with 20-Bit Universal Bus Transceivers
SCBS667
SN74LVT18512
64
Scan Test Devices with 18-Bit Universal Bus Transceivers
SCBS711
SN74LVTH18512
64
Scan Test Devices with 18-Bit Universal Bus Transceivers
SCBS671
SN74LVTH18514
64
Scan Test Devices with 20-Bit Universal Bus Transceivers
SCBS670
SN74ABT18640
56
Scan Test Devices with 18-Bit Inverting Bus Transceivers
SCBS267
SN74ABT18646
64
Scan Test Devices with 18-Bit Transceivers and Registers
SCBS131
SN74ABTH18646A
64
Scan Test Devices with 18-Bit Transceivers and Registers
SCBS166
SN74LVTH18646A
64
Scan Test Devices with 18-Bit Transceivers and Registers
SCBS311
SN74ABT18652
64
Scan Test Devices with 18-Bit Transceivers and Registers
SCBS132
SN74ABTH18652A
64
Scan Test Devices with 18-Bit Transceivers and Registers
SCBS167
LFBGA (low-profile fine-pitch ball grid array)
GKE = 96 pins
GKF = 114 pins
TVSOP (thin very small-outline package)
DGV = 14/16/20/24/48/56 pins
DBB = 80 pins
commercial package description and availability
schedule
PDIP (plastic dual-in-line package)
P = 8 pins
N = 14/16/20 pins
NT = 24/28 pins
VFBGA (very-thin-profile fine-pitch ball grid array)
GQL = 56 pins (also includes 48-pin functions)
QFP (quad flatpack)
RC = 52 pins (FB only)
PH = 80 pins (FIFO only)
PQ = 100/132 pins (FIFO only)
TQFP (plastic thin quad flatpack)
PAH
= 52 pins
PAG
= 64 pins (FB only)
PM
= 64 pins
PN
= 80 pins
PCA, PZ = 100 pins (FB only)
PCB
= 120 pins (FIFO only)
SSOP (shrink small-outline package)
DB
= 14/16/20/24/28/30/38 pins
DBQ = 16/20/24
DL
= 28/48/56 pins
SOIC (small-outline integrated circuit)
D
= 8/14/16 pins
DW = 16/20/24/28 pins
= Now
' = Planned
SOT (small-outline transistor)
DBV = 5 pins
DCK = 5 pins
QSOP (quarter-size outline package)
DBQ = 16/20/24 pins
TSSOP (thin shrink small-outline package)
PW = 8/14/16/20/24/28 pins
DGG = 48/56/64 pins
PLCC (plastic leaded chip carrier)
FN = 20/28/44/68/84 pins