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參數(shù)資料
| 型號： | SN54ALS38BFK |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS WITH OPEN-COLLECTOR OUTPUTS |
| 中文描述： | 四2輸入陽性開放NAND閃存緩沖區(qū)，集電極輸出 |
| 文件頁數(shù)： | 1/4頁 |
| 文件大?。?/td> | 69K |
| 代理商： | SN54ALS38BFK |
SN54ALS38B, SN74ALS38B
QUADRUPLE 2-INPUT POSITIVE-NAND BUFFERS
WITH OPEN-COLLECTOR OUTPUTS
SDAS196B – APRIL 1982 – REVISED DECEMBER 1994
Copyright
1994, Texas Instruments Incorporated
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Package Options Include Plastic
Small-Outline (D) Packages, Ceramic Chip
Carriers (FK), and Standard Plastic (N) and
Ceramic (J) 300-mil DIPs
description
These devices contain four independent 2-input
positive-NAND
buffers
outputs. They perform the Boolean functions
Y = A
B or Y = A + B in positive logic. The
open-collector outputs require pullup resistors to
perform correctly. These outputs may be
connected to other open-collector outputs to
implement active-low wired-OR or active-high
wired-AND functions. Open-collector devices
often are used to generate higher V
OH
levels.
The SN54ALS38B is characterized for operation
over the full military temperature range of –55
°
C
to 125
°
C. The SN74ALS38B is characterized for
operation from 0
°
C to 70
°
C.
with
open-collector
FUNCTION TABLE
(each gate)
INPUTS
OUTPUT
Y
A
H
B
H
L
L
X
H
X
L
H
logic symbol
logic diagram (positive logic)
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
1Y
3
2Y
6
3Y
8
4Y
11
&
1
1A
2
1B
4
2A
5
2B
9
3A
10
3B
12
4A
13
4B
1Y
3
2Y
6
3Y
8
4Y
11
This symbol is in accordance with ANSI/IEEE Std 91-1984 and
IEC Publication 617-12.
Pin numbers shown are for the D, J, and N packages.
SN54ALS38B . . . J PACKAGE
SN74ALS38B . . . D OR N PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
14
13
12
11
10
9
8
1A
1B
1Y
2A
2B
2Y
GND
V
CC
4B
4A
4Y
3B
3A
3Y
SN54ALS38B . . . FK PACKAGE
(TOP VIEW)
3
2
1 20 19
9 10 11 12 13
4
5
6
7
8
18
17
16
15
14
4A
NC
4Y
NC
3B
1Y
NC
2A
NC
2B
1
1
N
3
3
V
4
2
N
C
NC – No internal connection
G
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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