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參數(shù)資料
| 型號(hào)： | SN54ALS527 |
| 廠商： | Texas Instruments, Inc. |
| 英文描述： | FUSE-PROGRAMMABLE IDENTITY COMPARATORS |
| 中文描述： | 保險(xiǎn)絲可編程身分比較器 |
| 文件頁數(shù)： | 1/7頁 |
| 文件大?。?/td> | 95K |
| 代理商： | SN54ALS527 |
SN54ALS526, SN54ALS527, SN54ALS528
SN74ALS526, SN74ALS527, SN74ALS528
FUSE-PROGRAMMABLE IDENTITY COMPARATORS
SDAS051A – JUNE 1994 – REVISED MAY 1986
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1986, Texas Instruments Incorporated
5BASIC
1
Can Be Programmed and Verified on Most
Incoming Test Equipment
Reduces Board and Package Size for
Similar Fixed Comparator Functions
High-Speed Address Recognition
Package Options Include Plastic Small
Outline Packages, Ceramic Chip Carriers,
and Standard Plastic and Ceramic 300-mil
DIPs
Dependable Texas Instruments Quality and
Reliability
Programming Capabilities
’ALS526 – Fuse Programmable 16-Bit
Identity Comparator
’ALS527 – Fuse Programmable 8-Bit
Identity Comparator and 4-Bit
Comparator
’ALS528 – Fuse Programmable 12-Bit
Identity Comparator
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G
P0
P1
P2
P3
P4
P5
P6
P7
GND
V
CC
P = Q
P15
P14
P13
P12
P11
P10
P9
P8
SN54ALS526 . . . J PACKAGE
SN74ALS526 . . . DW OR N PACKAGE
(TOP VIEW)
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20
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12
11
G
P0
P1
P2
P3
P4
P5
P6
P7
GND
V
CC
P = Q
Q11
P11
Q10
P10
Q9
P9
Q8
P8
SN54ALS527 . . . J PACKAGE
SN74ALS527 . . . DW OR N PACKAGE
(TOP VIEW)
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16
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14
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9
G
P0
P1
P2
P3
P4
P5
GND
V
CC
P = Q
P11
P10
P9
P8
P7
P6
SN54ALS528 . . . J PACKAGE
SN54ALS528 . . . DW OR N PACKAGE
(TOP VIEW)
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2
1 20 19
9 10 11 12 13
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8
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16
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14
P15
P14
P13
P12
P11
P2
P3
P4
P5
P6
SN54ALS526 . . . FK PACKAGE
(TOP VIEW)
P
P
G
P
P
P
P
G
P
V
P
P
G
Q
P
P
P
G
P
V
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2
1 20 19
9 10 11 12 13
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5
6
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8
18
17
16
15
14
Q11
P11
Q10
P10
Q9
P2
P3
P4
P5
P6
SN54ALS527 . . . FK PACKAGE
(TOP VIEW)
P
N
P
P
P
P
G
N
V
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2
1 20 19
9 10 11 12 13
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5
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8
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P11
P10
NC
P9
P8
P1
P2
N C
P3
P4
SN54ALS528 . . . FK PACKAGE
(TOP VIEW)
NC–No internal connection
G
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
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