
Si5374
Rev. 1.1
11
Table 5. Performance Specifications
VDD = 1.8 V ±5% or 2.5 V ±10%, TA = –40 to 85 °C
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
tLOCKMP
Start of ICAL to
of LOL,
FASTLOCK enabled
—1
1.5
s
Si5374C-A-xL
—
0.8
1.0
Settle Ti
me2 Si5374B-A-xL
tSETTLE
Start of ICAL to FOUT within
5 ppm of final value
—1.2
1.5
s
Si5374C-A-xL
—
4.2
5.0
Output Clock Phase Change
tP_STEP
After clock switch
f3
128 kHz
—200
—
ps
Closed Loop Jitter Peaking
JPK
—
0.05
0.1
dB
Jitter Tolerance
JTOL
Jitter Frequency
Loop
Bandwidth
5000/BW
—
ns
pk-pk
Phase Noise
fout = 622.08 MHz
CKOPN
1 kHz Offset
—
–106
—
dBc/Hz
10 kHz Offset
—
–114
—
dBc/Hz
100 kHz Offset
—
–116
—
dBc/Hz
1 MHz Offset
—
–132
—
dBc/Hz
Spurious Noise
SPSPUR
Max spur @ n x F3
(n
1, n x F3 < 100 MHz)
—–70
—
dBc
Jitter Generation
JGEN
fIN =fOUT =622.08MHz,
BW = 120 Hz
LVPECL output
12 kHz–20 MHz
—
350
410
fs rms
50 kHz–80 MHz
—
410
—
fs rms
Notes:
1.
fin = fout = 622.08 MHz; BW = 7 Hz; LVDS, OSC = .121.109 MHz.
2.
Lock and settle time performance is dependent on the frequency plan and the OSC_P/OSC_N reference frequency
and LOCKT setting (see application note, "AN803: Lock and Settling Time Considerations for the Si5324/27/69/74
Any-Frequency Jitter Attenuating Clock ICs". Visit the Silicon Labs Technical Support web page at:
the lock time of your frequency plan.
3.
LOCKT = 3.3 ms.