CONTACT I<" />
參數(shù)資料
型號: SI3232PPTX-EVB
廠商: Silicon Laboratories Inc
文件頁數(shù): 33/128頁
文件大?。?/td> 0K
描述: BOARD EVAL W/DISCRETE INTERFACE
標準包裝: 1
系列: ProSLIC®
主要目的: 接口,模擬前端(AFE)
已用 IC / 零件: Si3232
已供物品: 板,CD
Si3232
128
Preliminary Rev. 0.96
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CONTACT INFORMATION
Silicon Laboratories Inc.
4635 Boston Lane
Austin, TX 78735
Tel: 1+(512) 416-8500
Fax: 1+(512) 416-9669
Toll Free: 1+(877) 444-3032
Email: ProSLICinfo@silabs.com
Internet: www.silabs.com
Silicon Laboratories, Silicon Labs, and ProSLIC are trademarks of Silicon Laboratories Inc.
Other products or brandnames mentioned herein are trademarks or registered trademarks of their respective holders.
The information in this document is believed to be accurate in all respects at the time of publication but is subject to change without notice.
Silicon Laboratories assumes no responsibility for errors and omissions, and disclaims responsibility for any consequences resulting from
the use of information included herein. Additionally, Silicon Laboratories assumes no responsibility for the functioning of undescribed features
or parameters. Silicon Laboratories reserves the right to make changes without further notice. Silicon Laboratories makes no warranty, rep-
resentation or guarantee regarding the suitability of its products for any particular purpose, nor does Silicon Laboratories assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation conse-
quential or incidental damages. Silicon Laboratories products are not designed, intended, or authorized for use in applications intended to
support or sustain life, or for any other application in which the failure of the Silicon Laboratories product could create a situation where per-
sonal injury or death may occur. Should Buyer purchase or use Silicon Laboratories products for any such unintended or unauthorized ap-
plication, Buyer shall indemnify and hold Silicon Laboratories harmless against all claims and damages.
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