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參數(shù)資料
| 型號： | SCANSTA111SM |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | EMITTER IR 850NM 5MM RADIAL |
| 中文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, PBGA49 |
| 封裝： | BGA-49 |
| 文件頁數(shù)： | 5/29頁 |
| 文件大小： | 524K |
| 代理商： | SCANSTA111SM |
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TABLE 2. Pin Descriptions
(Continued)
Pin Name
TRST
(0-2)
Description
No.
Pins
3
I/O
O
LOCAL TEST RESETS: A gated version of TRST
B
(Note 2). These outputs have 24mA of
drive current.
LOCAL PASS-THROUGH INPUTS: General purpose inputs which can be driven to the
backplane pin Y
B
. (Only on LSP
0
and LSP
1
. Only available when a single LSP is selected)
(Note 2). These inputs have an internal pull-up resistor.
LOCAL PASS-THROUGH OUTPUT: General purpose outputs which can be driven from the
backplane pin A
B
. (Only on LSP
0
and LSP
1
. Only available when a single LSP is selected)
(Note 2). These outputs have 24mA of drive current.
LOCAL ANALOG TEST BUS ENABLE: These analog pins serve as enable signals for analog
busses supporting the IEEE 1149.4 Mixed-Signal Test Bus standard (Note 2), or for
backplane physical layer changes (i.e.; TTL to LVDS). These outputs have 12mA of drive
current.
LOCAL TRI-STATE NOTIFICATION OUTPUTS: This signal is high when the local scan ports
are TRI-STATEd (Note 2). These pins are used for backplane physical layer changes (i.e.;
TTL to LVDS). These outputs have 12mA of drive current.
DEDICATED GENERAL PURPOSE INPUTS: These dedicated inputs (available in HDL) are
controlled by registers that can be read or written using the dot1 backplane pins (TDI
B
,
TDO
B
, TMS
B
and TCK
B
) (Note 3).
DEDICATED GENERAL PURPOSE OUTPUTS: These dedicated outputs (available in HDL)
are controlled by registers that can be read or written using the dot1 backplane pins (TDI
B
,
TDO
B
, TMS
B
and TCK
B
) (Note 3).
TEST ENABLE INPUT: This pin is used for factory test and should be tied to V
CC
for normal
operation.
Note 1:
The Silicon device will has seven (7) slot address pins. The HDL version is paramaterized to optionally allow 6, 7 or 8.
Note 2:
The Silicon device will has three (3) LSP’s. The HDL version is paramaterized to optionally allow up to 8 total LSPs.
Note 3:
Up to four (4) GPI/O’s per LSP. This feature is only available in the HDL version.
Note 4:
Refer to the IBIS model on our website for I/O characteristics.
A
(0-1)
2
I
Y
(0-1)
2
O
LSP_ACTIVE
(0-2)
3
O
TRIST
(0-2)
3
O
GPI
n
N/A
I
GPO
n
N/A
O
TEST ENABLE
1
I
Application Overview
ADDRESSING SCHEME
- The SCANSTA111 architecture
extends the functionality of the IEEE 1149.1 Standard by
supplementing that protocol with an addressing scheme
which allows a test controller to communicate with specific
’STA111s within a network of ’STA111s. That network can
include both multi-drop and hierarchical connectivity. In ef-
fect, the ’STA111 architecture allows a test controller to
dynamically select specific portions of such a network for
participation in scan operations. This allows a complex sys-
tem to be partitioned into smaller blocks for testing purposes.
The ’STA111 provides two levels of test-network partitioning
capability. First, a test controller can select individual
’STA111s, specific sets of ’STA111s (multi-cast groups), or all
’STA111s (broadcast). This ’STA111-selection process is
supported by a Level-1 communication protocol. Second,
within each selected ’STA111, a test controller can select
one or more of the chip’s three local scan-ports. That is,
individual local ports can be selected for inclusion in the
(single) scan-chain which a ’STA111 presents to the test
controller. This mechanism allows a controller to select spe-
cific terminal scan-chains within the overall scan network.
The port-selection process is supported by a Level-2 proto-
col.
HIERARCHICAL SUPPORT
- Multiple SCANSTA111’s can
be used to assemble a hierarchical boundary-scan tree. In
such a configuration, the system tester can configure the
local ports of a set of ’STA111s so as to connect a specific
set of local scan-chains to the active scan chain. Using this
capability, the tester can selectively communicate with spe-
cific portions of a target system. The tester’s scan port is
connected to the backplane scan port of a root layer of
’STA111s, each of which can be selected using multi-drop
addressing. A second tier of ’STA111s can be connected to
this root layer, by connecting a local port (LSP) of a root-
layer ’STA111 to the backplane port of a second-tier
’STA111. This process can be continued to construct a multi-
level scan hierarchy. ’STA111 local ports which are not cas-
caded into higher-level ’STA111s can be thought of as the
terminal leaves of a scan tree. The test master can select
one or more target leaves by selecting and configuring the
local ports of an appropriate set of ’STA111s in the test tree.
Check with your ATPG tool vendor to ensure support of this
feature.
State Machines
The ’STA111 is IEEE 1149.1-compatible, in that it supports
all required 1149.1 operations. In addition, it supports a
higher level of protocol, (Level 1), that extends the IEEE
1149.1 Std. to a multi-drop environment.
In multi-drop scan systems, a scan tester can select indi-
vidual ’STA111s for participation in upcoming scan opera-
tions. STA111 selection is accomplished by simultaneously
scanning a device address out to multiple STA111s. Through
an on-chip address matching process, only those ’STA111s
whose statically-assigned address matches the scanned-out
S
www.national.com
5
相關PDF資料 |
PDF描述 |
|---|---|
| SCANSTA111 | Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port |
| SCANSTA111MT | Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port |
| SCANSTA112 | 7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer |
| SCANSTA112SM | 7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer |
| SCANSTA112VS | 7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| SCANSTA111SM/NOPB | 功能描述:接口 - 專用 Enhanced SCAN Bridge Multidrop Port RoHS:否 制造商:Texas Instruments 產(chǎn)品類型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:BGA-59 |
| SCANSTA111SMX | 功能描述:接口 - 專用 RoHS:否 制造商:Texas Instruments 產(chǎn)品類型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:BGA-59 |
| SCANSTA111SMX/NOPB | 功能描述:接口 - 專用 RoHS:否 制造商:Texas Instruments 產(chǎn)品類型:1080p60 Image Sensor Receiver 工作電源電壓:1.8 V 電源電流:89 mA 最大功率耗散: 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:BGA-59 |
| SCANSTA112 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:7-port Multidrop IEEE 1149.1 (JTAG) Multiplexer |
| SCANSTA112_05 | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:7-Port Multidrop IEEE 1149.1 (JTAG) Multiplexer |
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