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參數(shù)資料
| 型號： | SCANPSC110FDMQB |
| 廠商： | NATIONAL SEMICONDUCTOR CORP |
| 元件分類： | 微控制器/微處理器 |
| 英文描述： | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| 中文描述： | SPECIALTY MICROPROCESSOR CIRCUIT, CDIP28 |
| 封裝： | CERAMIC, DIP-28 |
| 文件頁數(shù)： | 5/29頁 |
| 文件大?。?/td> | 459K |
| 代理商： | SCANPSC110FDMQB |
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Overview of SCANPSC110F Bridge
Functions
(Continued)
In multi-drop scan systems, a scan tester can select indi-
vidual ’PSC110Fs for participation in upcoming scan opera-
tions. ’PSC110F “selection” is accomplished by simulta-
neously
scanning
a
device
address
out
to
multiple
’PSC110Fs. Through an on-chip address matching process,
only those ’PSC110Fs whose statically-assigned address
matches the scanned-out address become selected to re-
ceive further instructions from the scan tester. ’PSC110F se-
lection is done using a “Level-1” protocol, while follow-on in-
structions are sent to selected ’PSC110Fs by using a
“Level-2” protocol.
The
state-machines (see Figure 2 ). The first of these is the
TAP-control state-machine, which is used to drive the
’PSC110Fs scan ports in conformance with the 1149.1 Stan-
dard (see Figure 17 of appendix). The second is the
’PSC110F-selection state-machine (Figure 3). The third
state-machine actually consists of three identical but inde-
pendent state-machines (see Figure 4), one per ’PSC110F
local
scan
port.
Each
of
state-machines allows individual local ports to be inserted
into and removed from the ’PSC110Fs overall scan chain.
’PSC110F
contains
three
distinct
but
coupled
these
scan
port-selection
The ’PSC110F selection state-machine performs the ad-
dress matching which gives the ’PSC110F its multi-drop ca-
pability. That
logic
supports
multi-cast,
and
broadcast.
state-machine implements the chip’s Level-1 protocol.
single-’PSC110F
The
’PSC110F-selection
access,
DS100327-4
FIGURE 2. SCANPSC110F Bridge State Machines
S
www.national.com
5
相關(guān)PDF資料 |
PDF描述 |
|---|---|
| SCANPSC110FFMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FLMQB | SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANSTA101 | RES 30K OHM 1/16W 0.1% 0402 SMD |
| SCANSTA111SM | EMITTER IR 850NM 5MM RADIAL |
| SCANSTA111 | Enhanced SCAN bridge Multidrop Addressable IEEE 1149.1 (JTAG) Port |
相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCANPSC110FDMQB WAF | 制造商:Texas Instruments 功能描述: |
| SCANPSC110FFMQB | 制造商:NSC 制造商全稱:National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) |
| SCANPSC110FLMQB | 功能描述:IC BRIDGE LCC SCAN MUL JTAG PORT RoHS:否 類別:集成電路 (IC) >> 接口 - 專用 系列:* 標準包裝:3,000 系列:- 應(yīng)用:PDA，便攜式音頻/視頻，智能電話 接口:I²C，2 線串口 電源電壓:1.65 V ~ 3.6 V 封裝/外殼:24-WQFN 裸露焊盤 供應(yīng)商設(shè)備封裝:24-QFN 裸露焊盤（4x4） 包裝:帶卷 (TR) 安裝類型:表面貼裝 產(chǎn)品目錄頁面:1015 (CN2011-ZH PDF) 其它名稱:296-25223-2 |
| SCANPSC110FSC | 功能描述:特定功能邏輯 SCAN JTAG Port RoHS:否 制造商:Texas Instruments 產(chǎn)品: 系列:SN74ABTH18502A 工作電源電壓:5 V 封裝 / 箱體:LQFP-64 封裝:Tube |
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