參數(shù)資料
型號(hào)： SCANPSC110F
廠商： National Semiconductor Corporation
英文描述： SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port(掃描橋分層多點(diǎn)可設(shè)定地址的JTAG端口)
中文描述： 掃描橋?qū)哟魏投帱c(diǎn)尋址JTAG端口（掃描橋分層多點(diǎn)可設(shè)定地址的的JTAG端口）
文件頁(yè)數(shù)： 26/29頁(yè)
文件大?。?/td> 459K
代理商： SCANPSC110F
Applications Example
(Continued)
8.
Assume that boards
#
6,
#
7 and
#
8 are identical, so that
it is possible to test them simultaneously. The tester first
addresses Board
#
6. Next the MCGRSELnstruction is
issued to place the Multi-Cast Group register into the ac-
tive scan chain, and the binary value “01” is shifted into
the MCGR. The GOTOWAIT instruction is then issued
returning all ’PSC110F’s to the Wait-For-Address state.
The MCGR for ’PSC110F
#
7 and ’PSC110F
#
8 are pro-
grammed the same as Board
#
6. Next the Multi-Cast ad-
dress “00111101” is issued by the tester, which causes
the ’PSC110F Selection controller of ’PSC110F
#
6–
#
8
to enter the Selected-Multi-Cast state. The LFSRON in-
struction is then issued to enable the signature compac-
tion circuitry on the selected ’PSC110Fs. The SAMPLE/
PRELOAD and EXTEST instructions are then used to
test the interconnects, similar to steps 4 and 5 above.
When the test sequence is complete, the GOTOWAIT
instruction is issued returning all ’PSC110Fs to the
Wait-For-Address state . ’PSC110Fs
#
6,
#
7, and
#
8 are
then addressed one at a time to read back the test sig-
nature from the LFSR (the LFSR is read by selecting it
with the LFSRSELinstruction, then scanning out its con-
tents.
After testing the interconnect on the individual boards,
the next step is to test the backplane interconnect. This
is a pair-wise test between Board
#
1 and each of the
other boards. Board
#
1 drives test patterns onto th back-
plane wiring, and the currently addressed slave board
senses the written data via its backplane scan interface.
In this example, the interconnect between Board
#
1 and
Board
#
2 is tested first. To test this interconnect, the
1149.1-compliant
backplane
SCAN182245A, SCAN ABT Test Access Logic, on each
board must be accessed for scan operations (see Figure
19 ). For more information on SCAN ABT live insertion
capabilities, refer to the SCAN182245A datasheet.
First, the system master (Board
#
1) is addressed and
selected. The 1149.1-compliant SCAN ABT transceivers
reside on the chain connected to LSP
on Board
#
1. The
mode register is re-configured so that only port LSP
2
is
9.
transceivers,
in the chain, and the UNPARKinstruction is then used to
access this chain. The appropriate instruction register
and data register scan sequencing is then performed to
apply a pattern to the backplane using the SCAN ABT
bus transceiver.
10. To test the backplane interconnect, LSP
of Board
#
1
must be parked in the Run-Test/Idle TAP controller
state, so that the EXTEST command will stay active
when Board
#
1 is de-selected (the PARKRTI instruction
is issued). The GOTOWAIT instruction is then issued to
return all boards to the Wait-For-Address state. Each
one of the slave boards is then addressed, one at a
time, to sample the backplane signals being driven by
Board
#
1. For example, Board
#
2 is addressed. The
mode register is reconfigured, (if needed), to select the
scan chain (LSP
) that includes the SCAN ABT back-
plane transceivers for Board
#
2. The UNPARK instruc-
tion is issued to unpark LSP
and insert it into the active
scan chain. The SAMPLE/PRELOAD instruction is is-
sued to the SCAN ABT backplane transceivers, (BY-
PASS to other components in the scan chain). The
backplane is sampled by sequencing the TAP controller
through the Capture-DRstate and the data is shifted out
and checked by the tester. The PARKRTI instruction is
then given to park LSP
of Board
#
2 in the Run-Test/Idle
state, and the GOTOWAIT instruction is issued to return
all ’PSC110Fs to the Wait-For-Address state so that the
next board, (Board
#
3), can be sampled. This procedure
is repeated for boards
#
3–
#
8, then Board
#
1 is selected
again, a new pattern is shifted out and driven by the EX-
TEST command, and the slave boards are again
sampled.
11. Step 10 is repeated until the backplane interconnect has
been sufficiently tested.
12. When testing is complete, the controller sends out the
SOFTRESET instruction to all ’PSC110Fs. This is ac-
complished by first using the broadcast address, “3B”
Hex, to select all ’PSC110Fs. The SOFTRESET com-
mand is then loaded, causing TMS
signals to go
high; this drives all local TAPs into the Test-Logic-Reset
state within five TCK cycles.
S
www.national.com
26
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SCANPSC110FDMQB 制造商:NSC 制造商全稱(chēng):National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
SCANPSC110FDMQB WAF 制造商:Texas Instruments 功能描述:
SCANPSC110FDMQB WAF 制造商:Texas Instruments 功能描述:
SCANPSC110FFMQB 制造商:NSC 制造商全稱(chēng):National Semiconductor 功能描述:SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
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