參數(shù)資料
型號(hào): SCAN18374T
廠商: National Semiconductor Corporation
英文描述: D Flip-Flop with TRI-STATE Outputs(帶三態(tài)輸出的D觸發(fā)器)
中文描述: D觸發(fā)器觸發(fā)器與三態(tài)輸出(帶三態(tài)輸出的?觸發(fā)器)
文件頁(yè)數(shù): 4/14頁(yè)
文件大小: 162K
代理商: SCAN18374T
Description of Boundary-Scan Circuitry
The scan cells used in the BOUNDARY-SCAN register are
one of the following two types depending upon their location.
Scan cell TYPE1 is intended to solely observe system data,
while TYPE2 has the additional ability to control system
data. (See IEEE Standard 1149.1 Figure 10–11 for a further
description of scan cell TYPE1 and Figure 10–12 for a fur-
ther description of scan cell TYPE2.)
Scan cell TYPE1 is located on each system input pin while
scan cell TYPE2 is located at each system output pin as well
as at each of the two internal active-high output enable sig-
nals. AOE controls the activity of the A-outputs while BOE
controls the activity of the B-outputs. Each will activate their
respective outputs by loading a logic high.
The BYPASS register is a single bit shift register stage iden-
tical to scan cell TYPE1. It captures a fixed logic low.
The INSTRUCTION register is an eight-bit register which
captures the value 00111101.
The two least significant bits of this captured value (01) are
required by IEEE Std 1149.1. The upper six bits are unique
to the SCAN18374T device. SCAN CMOS TestAccess Logic
devices do not include the IEEE 1149.1 optional identifica-
tion register. Therefore, this unique captured value can be
used as a “pseudo ID” code to confirm that the correct device
is placed in the appropriate location in the boundary scan
chain.
MSB
LSB
Instruction Code
00000000
10000001
10000010
00000011
All Others
Instruction
EXTEST
SAMPLE/PRELOAD
CLAMP
HIGHZ
BYPASS
Bypass Register Scan Chain Definition
Logic 0
DS100322-9
Instruction Register Scan Chain Definition
DS100322-10
www.national.com
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參數(shù)描述
SCAN18374TFMQB WAF 制造商:Texas Instruments 功能描述:
SCAN18374TSSC 功能描述:觸發(fā)器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時(shí)間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel
SCAN18374TSSCX 功能描述:觸發(fā)器 D-Type Flip-Flop RoHS:否 制造商:Texas Instruments 電路數(shù)量:2 邏輯系列:SN74 邏輯類型:D-Type Flip-Flop 極性:Inverting, Non-Inverting 輸入類型:CMOS 輸出類型: 傳播延遲時(shí)間:4.4 ns 高電平輸出電流:- 16 mA 低電平輸出電流:16 mA 電源電壓-最大:5.5 V 最大工作溫度:+ 85 C 安裝風(fēng)格:SMD/SMT 封裝 / 箱體:X2SON-8 封裝:Reel
SCAN1837TSSC 制造商:FAIRCHILD 制造商全稱:Fairchild Semiconductor 功能描述:Transparent Latch with 3-STATE Outputs
SCAN18540_YDB3026B WAF 制造商:Fairchild Semiconductor Corporation 功能描述: