參數(shù)資料
型號(hào)： SCAN18374T
廠商： National Semiconductor Corporation
英文描述： D Flip-Flop with TRI-STATE Outputs(帶三態(tài)輸出的D觸發(fā)器)
中文描述： D觸發(fā)器觸發(fā)器與三態(tài)輸出（帶三態(tài)輸出的?觸發(fā)器）
文件頁(yè)數(shù)： 11/14頁(yè)
文件大?。?/td> 162K
代理商： SCAN18374T
AC Operating Requirements
Scan Test Operation
Symbol
Parameter
V
CC
(V)
(Note 8)
Military
T
= 55C
to +125C
C
L
= 50 pF
Guaranteed Minimum
3.0
Units
t
S
Setup Time, H or L
Data to TCK (Note 9)
Hold Time, H or L
TCK to Data (Note 9)
Setup Time, H or L
AOE
1
, BOE
1
to TCK (Note 11)
Hold Time, H or L
TCK to AOE
1
, BOE
1
(Note 11)
Setup Time, H or L
Internal AOE, BOE
to TCK (Note 10)
Hold Time, H or L
TCK to Internal AOE,
BOE (Note 10)
Setup Time
ACP, BCP (Note 12) to TCK
Hold Time
TCK to ACP, BCP (Note 12)
Setup Time, H or L
TMS to TCK
Hold Time, H or L
TCK to TMS
Setup Time, H or L
TDI to TCK
Hold Time, H or L
TCK to TDI
Pulse Width TCK
5.0
ns
t
H
5.0
4.5
ns
t
S
5.0
3.0
ns
t
H
5.0
4.5
ns
t
S
5.0
3.0
ns
t
H
5.0
3.0
ns
t
S
5.0
3.0
ns
t
H
5.0
3.5
ns
t
S
5.0
8.0
ns
t
H
5.0
2.0
ns
t
S
5.0
4.0
ns
t
H
5.0
4.5
ns
t
W
5.0
H
L
15.0
5.0
25
ns
f
max
Maximum TCK
Clock Frequency
Wait Time, Power Up
to TCK
Power Down Delay
5.0
MHz
T
pu
5.0
100
ns
T
dn
0.0
100
ms
Note 8:
Voltage Range 5.0 is 5.0V
±
0.5V.
All Input Timing Delays involving TCK are measured from the rising edge of TCK.
Note 9:
This delay represents the timing relationship between the data Input and TCK at the associated scan cells numbered 0–8, 9–17, 18–26 and 27–35.
Note 10:
This delay represents the timing relationship between AOE, BOE and TCK at scan cells 36 and 39 only.
Note 11:
Timing pertains to BSR 38 and 41 only.
Note 12:
Timing pertains to BSR 37 and 40 only.
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