參數(shù)資料
型號(hào): S-80958
廠商: Seiko Instruments Inc.
英文描述: 5.8V±2.0% Bulit-In Delay Circuit High-Precision Voltage Detector(檢測(cè)范圍5.8 V±2.0%,內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
中文描述: 5.8V的± 2.0%Bulit,在延遲電路高精度電壓檢測(cè)器(檢測(cè)范圍5.8 V ± 2.0%,內(nèi)置延時(shí)電路高精度電壓檢測(cè)器)
文件頁數(shù): 12/24頁
文件大小: 172K
代理商: S-80958
BUILT-IN DELAY DIRCUIT HIGH-PRECISION VOLTAGE DETECTOR
S-809 Series
Seiko Instruments Inc.
11
5.
Through-type current
Through-type current refers to the current which flows instantaneously at the time of detection and release of a voltage
detector. Through-type current is large in CMOS output devices, and also flows to some extent in Nch open-drain output
devices.
6.
Oscillation
In applications where a resistor is connected to the voltage detector input (Figure 8), in the CMOS active low products for
example, the through-type current generated when the output goes from low to high (release) causes a voltage drop equal to
[through-type current]
×
[input resistance] across the resistor. When the resultant input voltage drops below the detection
voltage -V
DET
, the output voltage returns to its low level. In this state, the through-type current and its resultant voltage drop
have disappeared, and the output goes back from low to high. A through-type current is again generated, a voltage drop
appears, and the process repeats. This unstable condition is referred to as oscillation.
Misimplementation with input voltage divider
Standard Circuit
Connect directly the C
D
capacitor for delay between C
D
and V
SS
terminals.
RB
RA
OUT
V
IN
V
SS
V
DD
S-809XXAL
(
CMOS output products
)
Figure 8
V
DD
OUT
V
SS
R*
100k
* R is unnecessary for CMOS output products.
Figure 9
C
D
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