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參數資料
| 型號： | PUMA67E4001A-15E |
| 元件分類： | PROM |
| 英文描述： | 128K X 32 EEPROM 5V MODULE, 150 ns, CQMA68 |
| 封裝： | CERAMIC, LCC-68 |
| 文件頁數： | 6/15頁 |
| 文件大?。?/td> | 235K |
| 代理商： | PUMA67E4001A-15E |
ISSUE 4.3 : January 2001
PUMA 2/67E4001/A /B- 12/15/20
14
MB MULTICHIP MODULE SCREENING FLOW
SCREEN
TEST METHOD
LEVEL
Visual and Mechanical
Internal visual
2010 Condition B or manufacturers equivalent
100%
Temperature cycle
1010 Condition C (10 Cycles,-65oC to +150oC)
100%
Constant acceleration
2001 Condition B (Y1 & Y2) (10,000g)
100%
Endurance
Write Cycle endurance and
As per Internal Specification.
Data Retention performance
Burn-In
Pre-Burn-in electrical
Per applicable device specifications at T
A=+25
oC
100%
Burn-in
T
A=+125
oC,160hrs min
100%
Final Electrical Tests
Per applicable Device Specification
Static (DC)
a) @ T
A=+25
oC and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Functional
a) @ T
A=+25
oC and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Switching (AC)
a) @ T
A=+25
oC and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Percent Defective allowable (PDA)
Calculated at post-burn-in at T
A=+25
oC
10%
Hermeticity
1014
Fine
Condition A
100%
Gross
Condition C
100%
Quality Conformance
Per Applicable Device Specification
Sample
External Visual
2009 Per vendor or customer specification
100%
Military Screening Procedure
MultiChip Screening Flow for high reliability product is in accordance with Mil-883 method 5004 .
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