參數(shù)資料
型號(hào)： PPC5606BCLU64
廠(chǎng)商： Freescale Semiconductor
文件頁(yè)數(shù)： 74/112頁(yè)
文件大小： 0K
描述： MCU 32BIT 1M 64MHZ
標(biāo)準(zhǔn)包裝： 40
系列： MPC56xx Qorivva
核心處理器： e200z0h
芯體尺寸： 32-位
速度： 64MHz
連通性： CAN，I²C，LIN，SCI，SPI
外圍設(shè)備： POR，PWM，WDT
輸入/輸出數(shù)： 149
程序存儲(chǔ)器容量： 1MB（1M x 8）
程序存儲(chǔ)器類(lèi)型： 閃存
EEPROM 大?。?/td> 4K x 16
RAM 容量： 80K x 8
電壓 - 電源 (Vcc/Vdd)： 3 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器： A/D 29x10b，5x12b
振蕩器型： 內(nèi)部
工作溫度： -40°C ~ 85°C
封裝/外殼： 176-LQFP
包裝： 托盤(pán)
MPC5607B Microcontroller Data Sheet, Rev. 7
Electrical characteristics
Freescale Semiconductor
64
— Unexpected reset
— Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be reproduced
by manually forcing a low state on the reset pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device. When unexpected behavior is detected, the
software can be hardened to prevent unrecoverable errors occurring.
4.11.2
Electromagnetic interference (EMI)
The product is monitored in terms of emission based on a typical application. This emission test conforms to the IEC61967-1
standard, which specifies the general conditions for EMI measurements.
4.11.3
Absolute maximum ratings (electrical sensitivity)
Based on two different tests (ESD and LU) using specific measurement methods, the product is stressed in order to determine
its performance in terms of electrical sensitivity.
4.11.3.1
Electrostatic discharge (ESD)
Electrostatic discharges (a positive then a negative pulse separated by 1 second) are applied to the pins of each sample according
to each pin combination. The sample size depends on the number of supply pins in the device (3 parts
(n + 1) supply pin). This
test conforms to the AEC-Q100-002/-003/-011 standard.
Table 33. EMI radiated emission measurement1,2
1 EMI testing and I/O port waveforms per IEC 61967-1, -2, -4
2 For information on conducted emission and susceptibility measurement (norm IEC 61967-4), please contact your
local marketing representative.
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Max
—
SR — Scan range
—
0.150
1000 MHz
fCPU
SR — Operating frequency
—
64
—
MHz
VDD_LV SR — LV operating voltages
—
1.28
—
V
SEMI
CC T Peak level
VDD = 5V, TA =25°C,
LQFP144 package
Test conforming to IEC
61967-2,
fOSC = 8 MHz/fCPU =
64 MHz
No PLL frequency
modulation
—
18
dBV
± 2% PLL frequency
modulation
—
14
dBV
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