TSTG Storage temperature" />
參數資料
型號: PK10N512VLK100
廠商: Freescale Semiconductor
文件頁數: 71/71頁
文件大小: 0K
描述: IC ARM CORTEX MCU 512K 80-LQFP
產品培訓模塊: Kinetis® Cortex-M4 Microcontroller Family
標準包裝: 1
系列: Kinetis
核心處理器: ARM? Cortex?-M4
芯體尺寸: 32-位
速度: 100MHz
連通性: CAN,EBI/EMI,I²C,IrDA,SDHC,SPI,UART/USART
外圍設備: DMA,I²S,LVD,POR,PWM,WDT
輸入/輸出數: 56
程序存儲器容量: 512KB(512K x 8)
程序存儲器類型: 閃存
RAM 容量: 128K x 8
電壓 - 電源 (Vcc/Vdd): 1.71 V ~ 3.6 V
數據轉換器: A/D 27x16b,D/A 1x12b
振蕩器型: 內部
工作溫度: -40°C ~ 105°C
封裝/外殼: 80-LQFP
包裝: 托盤
4 Ratings
4.1 Thermal handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
TSTG
Storage temperature
–55
150
°C
TSDR
Solder temperature, lead-free
260
°C
Solder temperature, leaded
245
1. Determined according to JEDEC Standard JESD22-A103, High Temperature Storage Life.
2. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic
Solid State Surface Mount Devices.
4.2 Moisture handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
MSL
Moisture sensitivity level
3
1. Determined according to IPC/JEDEC Standard J-STD-020, Moisture/Reflow Sensitivity Classification for Nonhermetic
Solid State Surface Mount Devices.
4.3 ESD handling ratings
Symbol
Description
Min.
Max.
Unit
Notes
VHBM
Electrostatic discharge voltage, human body model
-2000
+2000
V
VCDM
Electrostatic discharge voltage, charged-device model
-500
+500
V
ILAT
Latch-up current at ambient temperature of 105°C
-100
+100
mA
1. Determined according to JEDEC Standard JESD22-A114, Electrostatic Discharge (ESD) Sensitivity Testing Human Body
Model (HBM).
2. Determined according to JEDEC Standard JESD22-C101, Field-Induced Charged-Device Model Test Method for
Electrostatic-Discharge-Withstand Thresholds of Microelectronic Components.
3. Determined according to JEDEC Standard JESD78, IC Latch-Up Test.
4.4 Voltage and current operating ratings
Ratings
K10 Sub-Family Data Sheet Data Sheet, Rev. 7, 02/2013.
Freescale Semiconductor, Inc.
9
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