參數(shù)資料
型號(hào): P610ARM-KW
廠商: Zarlink Semiconductor Inc.
英文描述: General purpose 32-bit microprocessor
中文描述: 通用32位微處理器
文件頁數(shù): 145/173頁
文件大?。?/td> 897K
代理商: P610ARM-KW
Boundary-Scan Test Interface
ARM610 Data Sheet
11-11
Notes
1
TCK
may be stopped indefinitely in either the low or high phase.
2
Assumes a 25pF load on tdo. Output timing derates at 0.072ns/pF of extra
load applied.
3
TDO
enable time applies when the TAP controller enters the Shift-DR or Shift-
IR states.
4
TDO
disable time applies when the TAP controller leaves the Shift-DR or Shift-
IR states.
5
For correct data latching, the I/O signals (from the core and the pads) must be
setup and held with respect to the rising edge of
TCK
in the CAPTURE-DR
state of the SAMPLE/PRELOAD, INTEST and EXTEST instructions.
6
Assumes that the data outputs are loaded with the AC test loads (see AC
parameter specification).
Symbol
Parameter
Min
Typ
Max
Units
Notes
Tbscl
tck low period
50
ns
1
Tbsch
tck high p
eriod
50
ns
1
Tbsis
tdi,tms setup to [TCr]
10
ns
Tbsih
tdi,tms hold from [TCr]
10
ns
Tbsod
TCf to tdo valid
30
ns
2
Tbsoh
tdo hold time
5
ns
2
Tbsoe
tdo enable time
5
ns
2,3
Tbsoz
tdo disable time
12.5
ns
2,4
Tbsss
I/O signal setup to [TCr]
5
ns
5
Tbssh
I/O signal hold from [TCr]
20
ns
5
Tbsdd
TCf to data output valid
30
ns
Tbsdh
data output hold time
5
ns
6
Tbsde
data output enable time
5
ns
6,7
Tbsdz
data output disable time
16.5
ns
6,8
Tbsr
Reset period
30
ns
Tbsrs
tms setup to [TRr]
10
ns
9
Tbsrh
tms hold from [TRr]
10
ns
9
Table 11-2: ARM610 boundary-scan interface timing
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