參數(shù)資料
型號: NUP1301ML3T1G
廠商: ON SEMICONDUCTOR
元件分類: 參考電壓二極管
英文描述: Low Capacitance Diode Array for ESD Protection in a Single Data Line
中文描述: UNIDIRECTIONAL, 2 ELEMENT, SILICON, TVS DIODE, TO-236AB
封裝: CASE 318-08, 3 PIN
文件頁數(shù): 3/4頁
文件大?。?/td> 45K
代理商: NUP1301ML3T1G
NUP1301ML3T1
http://onsemi.com
3
Figure 1. ESD Test Circuit
ESD Input Signal
APPLICATION NOTE
Electrostatic Discharge
A common means of protecting highspeed data lines is
to employ lowcapacitance diode arrays in a railtorail
configuration. Two devices per line are connected between
two fixed voltage references such as V
CC
and ground. When
the transient voltage exceeds the forward voltage (V
F
) drop
of the diode plus the reference voltage, the diodes direct the
surge to the supply rail or ground. This method has several
advantages including low loading capacitance, fast response
time, and inherent bidirectionality (within the reference
voltages). See Figure 1 for the test circuit used to verify the
ESD rating for this device.
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