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參數(shù)資料
| 型號(hào)： | NCV7382DR2G |
| 廠商： | ON Semiconductor |
| 文件頁(yè)數(shù)： | 7/16頁(yè) |
| 文件大小： | 0K |
| 描述： | IC TRANSCEIVER LIN ENH 8-SOIC |
| 產(chǎn)品變化通告： | Product Obsolescence 30/Sept/2009 |
| 標(biāo)準(zhǔn)包裝： | 2,500 |
| 類(lèi)型： | 收發(fā)器 |
| 驅(qū)動(dòng)器/接收器數(shù)： | 1/1 |
| 規(guī)程： | LIN |
| 電源電壓： | 7 V ~ 18 V |
| 安裝類(lèi)型： | 表面貼裝 |
| 封裝/外殼： | 8-SOIC（0.154"，3.90mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 8-SOICN |
| 包裝： | 帶卷 (TR) |
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NCV7382
http://onsemi.com
15
ESD/EMC Remarks
General Remarks
Electronic semiconductor products are sensitive to
Electro Static Discharge (ESD). Always observe Electro
Static Discharge control procedures whenever handling
semiconductor products.
ESD Test
The NCV7382 is tested according to MIL883D (human
body model).
EMC
The test on EMC impacts is done according to ISO
7637-1 for power supply pins and ISO 7637-3 for data and
signal pins.
POWER SUPPLY PIN VS
Test Pulse
Condition
Duration
1
t1 = 5.0 s/US = -100 V/tD = 2.0 ms
5000 Pulses
2
t1 = 0.5 s/US = 100 V/tD = 0.05 ms
5000 Pulses
3a/b
US = -150 V/US = 100 V
Burst 100 ns/10 ms/90 ms Break
1 h
5
Ri = 0.5 W, tD = 400 ms
tr = 0.1 ms/UP + US = 40 V
10 Pulses Every 1 Min
DATA AND SIGNAL PINS EN, BUS
Test Pulse
Condition
Duration
1
t1 = 5.0 s/US = -100 V/tD = 2.0 ms
1000 Pulses
2
t1 = 0.5 s/US = 100 V/tD = 0.05 ms
1000 Pulses
3a/b
US = -150 V/US = 100 V
Burst 100 ns/10 ms/90 ms Break
1000 Burst
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