
NB3RL02
http://onsemi.com
3
Table 3. ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Condition
Min
Max
Unit
VBATT
VBATT Voltage Range (Note 1) 0.3
7
V
CLK_REQ_1/2, MCLK_IN
0.3
VBATT + 0.3
V
VLDO, CLK_OUT_1/2
0.3
VBATT + 0.3
IIK
Input clamp current at VBATT, CLK_REQ_1/2,
and MCLK_IN
VI < 0
50
mA
IO
Continuous output current
CLK_OUT1/2
$20
mA
Continuous current through GND, VBATT, VL-
DO
Continuous current through
GND, VBATT, VLDO
$50
mA
ESD Rating
HumanBody Model
2000
V
ChargedDevice Model
1000
Machine Model
200
TJ
Operating virtual junction temperature
40
150
°C
TA
Operating ambient temperature range
40
85
°C
Tstg
Storage temperature range
55
150
°C
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may
affect device reliability.
1. The input negativevoltage and output voltage ratings may be exceeded if the input and output current ratings are observed.
2. All voltage values are with respect to network ground terminal.
Table 4. RECOMMENDED OPERATING CONDITIONS (Note 3) Symbol
Parameter
Min
Max
Unit
VBATT
Input voltage
VBATT
2.3
5.5
V
VI
Input voltage Amplitude
MCLK_IN, CLK_REQ1/2
0
1.89
V
VO
Output voltage
CLK_OUT1/2
0
1.8
V
VIH
Highlevel input voltage
CLK_REQ1/2
1.3
1.89
V
VIL
Lowlevel input voltage
CLK_REQ1/2
0
0.5
V
IOH
Highlevel output current, DC current
8
mA
IOL
Lowlevel output current, DC current
8
mA
3. All unused inputs of the device must be held at VCC or GND to ensure proper device operation.