參數(shù)資料
型號(hào): NAND512R3A2BZB1E
廠商: 意法半導(dǎo)體
英文描述: 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
中文描述: 128兆,256兆,512兆位,1千兆位(x8/x16)528 Byte/264字的頁(yè)面,1.8V/3V,NAND閃存芯片
文件頁(yè)數(shù): 36/57頁(yè)
文件大?。?/td> 410K
代理商: NAND512R3A2BZB1E
NAND128-A, NAND256-A, NAND512-A, NAND01G-A
36/57
Table 19. DC Characteristics, 3V Devices
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
I
DD1
Operating
Current
Sequential
Read
t
RLRL
minimum
E=V
IL,
I
OUT
= 0 mA
-
10
20
mA
I
DD2
Program
-
-
10
20
mA
I
DD3
Erase
-
-
10
20
mA
I
DD4
Stand-by Current (TTL),
128Mb, 256Mb, 512Mb devices
E=V
IH
, WP=0V/V
DD
-
-
1
mA
Stand-by Current (TTL)
512Mb and 1Gb Dual Die devices
-
-
2
mA
I
DD5
Stand-By Current (CMOS)
128Mb, 256Mb, 512Mb devices
E=V
DD
-0.2,
WP=0/V
DD
-
10
50
μA
Stand-By Current (CMOS)
512Mb and 1Gb Dual Die devices
-
20
100
μA
I
LI
Input Leakage Current
V
IN
= 0 to V
DD
max
-
-
±10
μA
I
LO
Output Leakage Current
V
OUT
= 0 to V
DD
max
-
-
±10
μA
V
IH
Input High Voltage
-
2.0
-
V
DD
+0.3
V
V
IL
Input Low Voltage
-
0.3
-
0.8
V
V
OH
Output High Voltage Level
I
OH
=
400μA
2.4
-
-
V
V
OL
Output Low Voltage Level
I
OL
= 2.1mA
-
-
0.4
V
I
OL
(RB)
Output Low Current (RB)
V
OL
= 0.4V
8
10
mA
V
LKO
V
DD
Supply Voltage (Erase and
Program lockout)
-
-
-
2.5
V
相關(guān)PDF資料
PDF描述
NAND512R3A2CZA6T 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
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NAND128W3A0CZB1 128 Mbit, 256 Mbit, 512 Mbit, 1 Gbit (x8/x16) 528 Byte/264 Word Page, 1.8V/3V, NAND Flash Memories
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