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參數(shù)資料
| 型號： | MN100352 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | Low Power 8-Bit Buffer with Cut-Off Drivers(低功耗8位帶截止驅動器的緩沖器) |
| 中文描述： | 低功耗8位緩沖的截止點驅動器（低功耗8位帶截止驅動器的緩沖器） |
| 文件頁數(shù)： | 1/8頁 |
| 文件大小： | 56K |
| 代理商： | MN100352 |
Original Creation Date: 10/30/95
Last Update Date: 08/24/98
Last Major Revision Date: 08/03/98
MN100352-X REV 1A0
MICROCIRCUIT DATA SHEET
LOW POWER 8-BIT BUFFER WITH CUT-OFF DRIVERS
General Description
The F100352 contains an eight bit buffer, individual inputs (Dn), outputs (Qn), and a data
output enable pin (OEN). A Q output follows its D input when the OEN pin is LOW. A HIGH
on OEN holds the outputs in a cut-off state. The cut-off state is designed to be more
negative than a normal ECL LOW level. This allows the output emitter- followers to turn
off when the termination supply is -2.0V, presenting a high impedance to the data bus.
This high impedance reduces termination power and prevents loss of low state noise margin
when several loads share the bus.
The F100352 outputs are designed to drive a doubly terminated 50 ohm transmission line (25
ohm load impedance). All inputs have 50K ohms pull-down resistors.
NS Part Numbers
100352DMQB
100352FMQB
Industry Part Number
100352
Prime Die
F352
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
1
2
3
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5
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8A
8B
9
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Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
+25
+125
-55
+25
+125
-55
+25
+125
-55
+25
+125
-55
1
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