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參數(shù)資料
| 型號(hào)： | MN100324 |
| 廠商： | National Semiconductor Corporation |
| 英文描述： | Hex TTL-to-ECL Translator(六TTL-ECL電平轉(zhuǎn)換器) |
| 中文描述： | 十六進(jìn)制的TTL到ECL翻譯（六的TTL - ECL電平轉(zhuǎn)換器） |
| 文件頁數(shù)： | 1/8頁 |
| 文件大?。?/td> | 79K |
| 代理商： | MN100324 |
Original Creation Date: 10/30/95
Last Update Date: 07/30/99
Last Major Revision Date: 03/24/99
MN100324-X REV 2A0
MICROCIRCUIT DATA SHEET
HEX TTL-to-ECL TRANSLATOR
General Description
The 100324 is a hex translator, designed to convert TTL logic levels to 100K ECL logic
levels. The inputs are compatible with standard or Schottky TTL. A common Enable Input
(E), when LOW, holds all inverting outputs HIGH and holds all true inputs LOW. The
differential outputs allow each circuit to be used as an inverting/non-inverting
translator or as a differential line driver. The output levels are voltage compensated.
When the circuit is used in the differential mode, the 100324, due to its high common mode
rejection, overcomes voltage gradients between the TTL and ECL ground systems. The VEE
and VTTL power may be applied in either order.
NS Part Numbers
100324DMQB
100324FMQB
100324J-QMLV
100324W-QMLV
Industry Part Number
100324
Prime Die
F324
Controlling Document
5962-91530
Processing
MIL-STD-883, Method 5004
Quality Conformance Inspection
MIL-STD-883, Method 5005
Subgrp Description Temp ( C)
1
2
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5
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8A
8B
9
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11
Static tests at
Static tests at
Static tests at
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
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