
MJ2500 MJ2501 MJ3000 MJ3001
3–426
Motorola Bipolar Power Transistor Device Data
ELECTRICAL CHARACTERISTICS (TC = 25_C unless otherwise noted)
Characteristic
Symbol
Min
Max
Unit
OFF CHARACTERISTICS
Collector Emitter Breakdown Voltage(1)
MJ2500, MJ3000
(IC = 100 mAdc, IB = 0)
MJ2501, MJ3001
V(BR)CEO
60
80
—
Vdc
Collector–Emitter Leakage Current
(VEB = 60 Vdc, RBE = 1.0 k ohm)
MJ2500, MJ3000
(VEB = 80 Vdc, RBE = 1.0 k ohm)
MJ2501, MJ3001
(VEB = 60 Vdc, RBE = 1.0 k ohm, TC = 150_C)
MJ2500, MJ3000
(VEB = 80 Vdc, RBE = 1.0 k ohm, TC = 150_C)
MJ2501, MJ3001
ICER
—
1.0
5.0
mAdc
Emitter Cutoff Current (VBE = 5.0 Vdc, IC = 0)
IEBO
—
2.0
mAdc
Collector Emitter Leakage Current (VCE = 30 Vdc, IB = 0)
MJ2500, MJ3000
(VCE = 40 Vdc, IB = 0)
MJ2501, MJ3001
ICEO
—
1.0
mAdc
ON CHARACTERISTICS(1)
DC Current Gain (IC = 5.0 Adc, VCE = 3.0 Vdc)
hFE
1000
—
—
Collector–Emitter Saturation Voltage (IC = 5.0 Adc, IB = 20 mAdc)
(IC = 10 Adc, IB = 50 mAdc)
VCE(sat)
—
2.0
4.0
Vdc
Base Emitter Voltage (IC = 5.0 Adc, VCE = 3.0 Vdc)
VBE(on)
—
3.0
Vdc
(1)Pulse Test: Pulse Width v 300 s, Duty Cycle v 2.0%.
Figure 2. DC Current Gain
IC, COLLECTOR CURRENT (AMP)
0.01 0.02
0.05
0.1
0.2
0.5
1.0
2.0
10
h
FE
,DC
C
URREN
T
GAIN
TJ = 150°C
25
°C
–55
°C
VCE = 3.0 Vdc
500
200
100
50,000
5000
20,000
2000
1000
10,000
5.0
Figure 3. Small–Signal Current Gain
f, FREQUENCY (Hz)
500
300
100
3000
h
FE
,SMALL–SIGNAL
CURRENT
GAIN
200
2000
1000
30
50
TC = 25°C
VCE = 3.0 Vdc
IC = 5.0 Adc
104
103
105
106
50
IC, COLLECTOR CURRENT (AMP)
VBE(sat) @ IC/IB = 250
V
,VOL
TAGE
(VOL
TS)
Figure 4. “On” Voltages
VCE(sat) @ IC/IB = 250
TJ = 25°C
VBE @ VCE = 3.0 V
0.01
0.2
0.5
0.05
1.0
2.0
10
5.0
3.5
2.5
2.0
1.5
1.0
0
SECONDARY BREAKDOWN LIMITED
THERMALLY LIMITED @ TC = 25°C
BONDING WIRE LIMITED
10
1.0
Figure 5. DC Safe Operating Area
7.0
2.0
10
20
100
TJ = 200°C
0.2
3.0
0.5
I C
,COLLECT
OR
CURRENT
(AMP)
VCE, COLLECTOR–EMITTER VOLTAGE (VOLTS)
5.0
30
70
1.0
0.1
2.0
50
3.0
5.0 7.0
MJ2500, MJ3000
MJ2501, MJ3001
0.5
3.0
0.1
0.02
0.7
0.3
There are two limitations on the power handling ability of a
transistor: junction temperature and secondary breakdown.
Safe operating area curves indicate IC – VCE limits of the
transistor that must be observed for reliable operation; e.g.,
the transistor must not be subjected to greater dissipation
than the curves indicate.
At high case temperatures, thermal limitations will reduce
the power that can be handled to values less than the limita-
tions imposed by secondary breakdown.