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MCM62110
5
MOTOROLA FAST SRAM
AC OPERATING CONDITIONS AND CHARACTERISTICS
(VCC = 5.0 V
±
10%, VCCQ = 5.0 V or 3.3 V
±
10%, TA = 0 to + 70
°
C, Unless Otherwise Noted)
Input Timing Measurement Reference Level
Input Pulse Levels
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input Rise/Fall Time
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . . . .
0 to 3.0 V
3 ns
Output Measurement Timing Level
Output Load
. . . . . . . . . . . .
1.5 V
. . . . . . . . . . . . . . . . . . . . . . .
See Figure 1A Unless Otherwise Noted
READ CYCLE
(See Note 1)
MCM62110–15
MCM62110–17
MCM62110–20
Parameter
Symbol
Min
Max
Min
Max
Min
Max
Unit
Notes
Read Cycle Time Clock High to Clock High
tKHKH
15
—
17
—
20
—
ns
1, 2
Clock Low Pulse Width
tKLKH
5
—
5
—
5
—
ns
Clock High Pulse Width
tKHKL
7
—
7
—
7
—
ns
Clock High to DPE Valid
tKHDPEV
—
7
—
8
—
10
ns
5
Clock High to Output Valid
tKHQV
—
7
—
7.5
—
10
ns
4, 3
Clock (K) High to Output Low Z After Write
tKHQX1
8
—
8
—
8
—
ns
Output Hold from Clock High
tKHQX2
5
—
5
—
5
—
ns
4, 6
Clock High to Q High–Z (E1 or E2 = False)
tKHQZ
—
8
—
9
—
10
ns
6
Setup TImes:
A
W
E1, E2
PIE
SIE
POE
SOE
tAVKL
tWHKH
tEVKL
tPIEHKH
tSIEHKH
tPOEVKH
tSOEVKH
2.5
—
2.5
—
2.5
—
ns
7
7
Hold Times:
A
W
E1, E2
PIE
SIE
POE
SOE
tKLAX
tKHWX
tKLEX
tKHPIEX
tKHSIEX
tKHPOEX
tKHSOEX
2
—
2
—
2
—
ns
7
7
Output Enable High to Q High–Z
tPOEHQZ
tSOEHQZ
0
8
0
9
0
9
ns
6
Output Hold from Output Enable High
tPOEHQX
tSOEHQX
5
—
5
—
5
—
ns
6
Output Enable Low to Q Active
tPOELQX
tSOELQX
0
—
0
—
0
—
ns
6
Output Enable Low to Output Valid
tPOELQV
tSOELQV
—
5
—
6
—
8
ns
NOTES:
1. A read is defined by W high for the setup and hold times.
2. All read cycle timing is referenced from K, SOE, or POE.
3. Access time is controlled by tKLQV if the clock low pulse width is less than (tKLQV–tKHQV); otherwise it is controlled by KHQV.
4. K must be at a high level for outputs to transition.
5. DPE is valid exactly one clock cycle after the output data is valid.
6. Transition is measured
±
500 mV from steady–state voltage with output load of Figure 1B. This parameter is sampled and not 100% tested.
At any given voltage and temperature, tKHQZ is less than tKHQX, tPOEHQZ is less than tPOELQX for a given device, and tSOEHQZ is less
than tSOELQX for a given device.
7. These read cycle timings are used to guarantee proper parity operation only.