Solving Equation 1 an" />
參數(shù)資料
型號： MC9S08JE64CLH
廠商： Freescale Semiconductor
文件頁數(shù)： 7/44頁
文件大?。?/td> 0K
描述： IC MCU 8BIT 64K FLASH 64LQFP
標(biāo)準(zhǔn)包裝： 160
系列： S08
核心處理器： S08
芯體尺寸： 8-位
速度： 48MHz
連通性： I²C，SCI，SPI，USB
外圍設(shè)備： LVD，POR，PWM，WDT
輸入/輸出數(shù)： 33
程序存儲器容量： 64KB（64K x 8）
程序存儲器類型： 閃存
RAM 容量： 12K x 8
電壓 - 電源 (Vcc/Vdd)： 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器： A/D 6x12b
振蕩器型： 內(nèi)部
工作溫度： -40°C ~ 85°C
封裝/外殼： 64-LQFP
包裝： 托盤
Preliminary Electrical Characteristics
Freescale Semiconductor
15
Solving Equation 1 and Equation 2 for K gives:
K = PD × (TA + 273°C) + θJA × (PD)
2
Eqn. 3
where K is a constant pertaining to the particular part. K can be determined from Equation 3 by measuring PD (at equilibrium)
for a known TA. Using this value of K, the values of PD and TJ can be obtained by solving Equation 1 and Equation 2 iteratively
for any value of TA.
2.4
ESD Protection Characteristics
Although damage from static discharge is much less common on these devices than on early CMOS circuits, normal handling
precautions should be used to avoid exposure to static discharge. Qualification tests are performed to ensure that these devices
can withstand exposure to reasonable levels of static without suffering any permanent damage.
All ESD testing is in conformity with CDF-AEC-Q00 Stress Test Qualification for Automotive Grade Integrated Circuits.
(http://www.aecouncil.com/) This device was qualified to AEC-Q100 Rev E.
A device is considered to have failed if, after exposure to ESD pulses, the device no longer meets the device specification
requirements. Complete dc parametric and functional testing is performed per the applicable device specification at room
temperature followed by hot temperature, unless specified otherwise in the device specification.
Table 7. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human Body
Series Resistance
R1
1500
Ω
Storage Capacitance
C
100
pF
Number of Pulse per pin
—
3
—
Machine
Series Resistance
R1
0
Ω
Storage Capacitance
C
200
pF
Number of Pulse per pin
—
3
—
Latch-up
Minimum input voltage limit
—
–2.5
V
Maximum input voltage limit
—
7.5
V
Table 8. ESD and Latch-Up Protection Characteristics
#
Rating
Symbol
Min
Max
Unit
C
1
Human Body Model (HBM)
VHBM
±2000
—
V
T
2
Machine Model (MM)
VMM
±200
—
V
T
3
Charge Device Model (CDM)
VCDM
±500
—
V
T
4
Latch-up Current at TA = 125°CILAT
±100
—
mA
T
Preliminary — Subject to Change
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MC9S08JE64VLH 功能描述:8位微控制器 -MCU 8BIT 64K FLASH RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT
MC9S08JM16 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:Microcontrollers
MC9S08JM16CGT 功能描述:8位微控制器 -MCU 8BIT 16K FLASH.1024 RoHS:否 制造商:Silicon Labs 核心:8051 處理器系列:C8051F39x 數(shù)據(jù)總線寬度:8 bit 最大時(shí)鐘頻率:50 MHz 程序存儲器大小:16 KB 數(shù)據(jù) RAM 大小:1 KB 片上 ADC:Yes 工作電源電壓:1.8 V to 3.6 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:QFN-20 安裝風(fēng)格:SMD/SMT
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MC9S08JM16CLC 制造商:Freescale Semiconductor 功能描述:IC 8-BIT MCU 48MHZ LQFP-32
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