參數(shù)資料
型號: MAX6900ETT
廠商: Maxim Integrated Products, Inc.
英文描述: Hex Bus Drivers With 3-State Outputs 16-CFP -55 to 125
中文描述: 塑封器件
文件頁數(shù): 4/8頁
文件大?。?/td> 47K
代理商: MAX6900ETT
V. Quality Assurance Information
A. Quality Assurance Contacts:
Jim Pedicord (Reliability Lab Manager)
Bryan Preeshl (Executive Director of QA)
Kenneth Huening (Vice President)
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135
°
C biased (static) life test are shown in
Table 1
. Using these results, the Failure
Rate (
λ
) is calculated as follows:
λ
= 1 = 1.83 (Chi square value for MTTF upper limit)
MTTF
192 x 4389 x 160 x 2
Thermal acceleration factor assuming a 0.8eV activation energy
λ
= 6.79 x 10
-9
λ
= 6.79 F.I.T. (60% confidence level @ 25
°
C)
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim also performs weekly Burn-In on samples from production to assure the reliability of its processes. The
reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates
to 3 failures in an 80 piece sample. The Burn-In Schematic #06-5635 shows the static circuit used for this test
Maxim performs failure analysis on lots exceeding this level. Maxim also performs 1000 hour life test monitors
quarterly for each process. This data is published in the Product Reliability Report (
RR-1M
).
B. Moisture Resistance Tests
Maxim evaluates pressure pot stress from every assembly process during qualification of each new
design. Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard
85
°
C/85%RH or HAST tests are performed quarterly per device/package family.
C. E.S.D. and Latch-Up Testing
The DW04 die type has been found to have all pins able to withstand a transient pulse of
±
1000V, per Mil-
Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device
withstands a current of
±
250mA.
B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
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